{"id":"https://openalex.org/A5080973266","orcid":null,"observed_orcids":[],"display_name":"Yair Eran","raw_author_names":["Yair Eran"],"full_name":"Yair Eran","works_count":27,"cited_by_count":14,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":2,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5080973266","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210100008","ror":"https://ror.org/01425vp67","display_name":"Applied Materials (Israel)","country_code":"IL","type":"company","lineage":["https://openalex.org/I193427800","https://openalex.org/I4210100008"]},"years":[2014,2001,2000,1999]}],"last_known_institutions":[{"id":"https://openalex.org/I4210100008","ror":"https://ror.org/01425vp67","display_name":"Applied Materials (Israel)","country_code":"IL","type":"company","lineage":["https://openalex.org/I193427800","https://openalex.org/I4210100008"]}],"topics":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","count":26,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":26,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","count":12,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":0.0002337,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":0.0001176,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11517","display_name":"Advanced optical system design","value":4.91e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":4.12e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":1.59e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"146617872","wikidata":"https://www.wikidata.org/wiki/Q1391868","display_name":"Reticle","score":0.9983435273170471},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.833277702331543},{"id":"160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","score":0.7491248250007629},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7076042294502258},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3288149833679199}],"counts_by_year":[{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Yair Eran"],"block_key":"y eran","works_api_url":"https://api.openalex.org/works?filter=author.id:A5080973266","updated_date":"2026-10-27T12:30:23","created_date":"2016-06-24T00:00:00"}