{"id":"https://openalex.org/A5080168241","orcid":"https://orcid.org/0000-0001-7876-7584","observed_orcids":["https://orcid.org/0000-0001-7876-7584"],"display_name":"Joko Muslim","raw_author_names":["J. Muslim","Joko Muslim","Muslim, Joko"],"full_name":"Muslim, Joko","works_count":31,"cited_by_count":175,"summary_stats":{"2yr_mean_citedness":1.2857142857142858,"h_index":8,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5080168241","orcid":"https://orcid.org/0000-0001-7876-7584","observed_orcids":["https://orcid.org/0000-0001-7876-7584"]},"affiliations":[{"institution":{"id":"https://openalex.org/I106785703","ror":"https://ror.org/05sbt2524","display_name":"Institut polytechnique de Grenoble","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},"years":[2022,2019]},{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2022,2019,2017]},{"institution":{"id":"https://openalex.org/I134635517","ror":"https://ror.org/00apj8t60","display_name":"Bandung Institute of Technology","country_code":"ID","type":"education","lineage":["https://openalex.org/I134635517"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I207014233","ror":"https://ror.org/02278tr80","display_name":"Kyushu Institute of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I207014233"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I4210165697","ror":"https://ror.org/05hyx5a17","display_name":"Laboratoire de G\u00e9nie \u00c9lectrique de Grenoble","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210165697","https://openalex.org/I899635006"]},"years":[2022,2019,2018,2017]},{"institution":{"id":"https://openalex.org/I4387153183","ror":"https://ror.org/05tdc8560","display_name":"Institut Teknologi PLN","country_code":"ID","type":"education","lineage":["https://openalex.org/I4387153183"]},"years":[2026,2025,2024]},{"institution":{"id":"https://openalex.org/I4392738279","ror":"https://ror.org/05v727m31","display_name":"Communaut\u00e9 Universit\u00e9 Grenoble Alpes","country_code":"FR","type":"education","lineage":["https://openalex.org/I4392738279","https://openalex.org/I899635006"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I4405274921","ror":"https://ror.org/02ktsve17","display_name":"Politeknik LP3I Jakarta","country_code":"ID","type":"education","lineage":["https://openalex.org/I4405274921"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I899635006","ror":"https://ror.org/02rx3b187","display_name":"Universit\u00e9 Grenoble Alpes","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},"years":[2022,2019]}],"last_known_institutions":[{"id":"https://openalex.org/I4387153183","ror":"https://ror.org/05tdc8560","display_name":"Institut Teknologi PLN","country_code":"ID","type":"education","lineage":["https://openalex.org/I4387153183"]}],"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","count":15,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","count":5,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14444","display_name":"Power Systems and Renewable Energy","count":5,"subfield":{"id":"https://openalex.org/subfields/2102","display_name":"Energy Engineering and Power Technology"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","value":0.000121,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13429","display_name":"Electricity Theft Detection Techniques","value":8.28e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","value":7.38e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","value":6.83e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","value":3.64e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8678485155105591},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7739999890327454},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5123592615127563},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.4792780578136444},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4390999972820282}],"counts_by_year":[{"year":2013,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2014,"works_count":2,"oa_works_count":0,"cited_by_count":5},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":13},{"year":2018,"works_count":4,"oa_works_count":0,"cited_by_count":6},{"year":2019,"works_count":3,"oa_works_count":1,"cited_by_count":19},{"year":2020,"works_count":1,"oa_works_count":1,"cited_by_count":18},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":20},{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":21},{"year":2024,"works_count":5,"oa_works_count":1,"cited_by_count":17},{"year":2025,"works_count":5,"oa_works_count":4,"cited_by_count":11},{"year":2026,"works_count":4,"oa_works_count":4,"cited_by_count":14}],"display_name_alternatives":["J. Muslim","Joko Muslim","Muslim, Joko"],"block_key":"j muslim","works_api_url":"https://api.openalex.org/works?filter=author.id:A5080168241","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5080168241","updated_date":"2026-11-11T13:02:13","created_date":"2016-06-24T00:00:00"}