{"id":"https://openalex.org/A5079931455","orcid":null,"observed_orcids":[],"display_name":"Glen David Via","raw_author_names":["G. D. VIA","G. D. Via","G. David Via","G. Via","G.D Via","G.D. Via","GLEN D. VIA","Glen D Via","Glen D. Via","Glen David Via","Glen Via"],"full_name":"Glen David Via","works_count":78,"cited_by_count":2009,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":25,"i10_index":44},"ids":{"openalex":"https://openalex.org/A5079931455","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1280414376","ror":"https://ror.org/02e2egq70","display_name":"United States Air Force Research Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},"years":[2021,2020,2016,2015,2014,2013,2012,2011,2010,2009,2008,2007,2006,2005,2004,2003,2002,1998]},{"institution":{"id":"https://openalex.org/I19648265","ror":"https://ror.org/04qk6pt94","display_name":"Wright State University","country_code":"US","type":"education","lineage":["https://openalex.org/I19648265"]},"years":[1997]},{"institution":{"id":"https://openalex.org/I2799950915","ror":"https://ror.org/0097e1k27","display_name":"Wright-Patterson Air Force Base","country_code":"US","type":"other","lineage":["https://openalex.org/I1330347796","https://openalex.org/I2799950915","https://openalex.org/I4210089612","https://openalex.org/I4210102105"]},"years":[2021,2020,2016,2015,2013,2012,2011,2010,2009,2006,2005,2004,2003,2002,1998,1997,1996,1995]},{"institution":{"id":"https://openalex.org/I4210089612","ror":"https://ror.org/006gmme17","display_name":"United States Air Force","country_code":"US","type":"government","lineage":["https://openalex.org/I1330347796","https://openalex.org/I4210089612","https://openalex.org/I4210102105"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I4388482655","ror":"https://ror.org/054yf8v46","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","country_code":"US","type":"government","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]},"years":[2016,2015,2013,2011,2010,2009,2008,2007,2005,2004,2003,2002,2001]},{"institution":{"id":"https://openalex.org/I4388482690","ror":"https://ror.org/03jvtcb24","display_name":"Wright Laboratory","country_code":"US","type":"government","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482690","https://openalex.org/I4389425425"]},"years":[2021,2013,2011,2010,2004,2003,2002,1998,1997,1996,1995]},{"institution":{"id":"https://openalex.org/I4389425221","ror":"https://ror.org/03eeh5j48","display_name":"Wright Research and Development Center","country_code":"US","type":"government","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425221","https://openalex.org/I4389425425"]},"years":[2002]}],"last_known_institutions":[{"id":"https://openalex.org/I1280414376","ror":"https://ror.org/02e2egq70","display_name":"United States Air Force Research Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},{"id":"https://openalex.org/I2799950915","ror":"https://ror.org/0097e1k27","display_name":"Wright-Patterson Air Force Base","country_code":"US","type":"other","lineage":["https://openalex.org/I1330347796","https://openalex.org/I2799950915","https://openalex.org/I4210089612","https://openalex.org/I4210102105"]},{"id":"https://openalex.org/I4388482690","ror":"https://ror.org/03jvtcb24","display_name":"Wright Laboratory","country_code":"US","type":"government","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482690","https://openalex.org/I4389425425"]}],"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","count":61,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":59,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":22,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","value":0.0002699,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","value":0.0002622,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":0.0001283,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":0.0001132,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","value":8.96e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9196562767028809},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.807098925113678},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.6482717394828796},{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.5877959132194519},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.488560289144516}],"counts_by_year":[{"year":1995,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1997,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2002,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":11,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":9,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":7,"oa_works_count":2,"cited_by_count":0},{"year":2012,"works_count":3,"oa_works_count":0,"cited_by_count":117},{"year":2013,"works_count":2,"oa_works_count":0,"cited_by_count":130},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":123},{"year":2015,"works_count":5,"oa_works_count":3,"cited_by_count":108},{"year":2016,"works_count":5,"oa_works_count":1,"cited_by_count":98},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":109},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":96},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":121},{"year":2020,"works_count":4,"oa_works_count":0,"cited_by_count":114},{"year":2021,"works_count":5,"oa_works_count":2,"cited_by_count":122},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":110},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":112},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":97},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":107},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":81}],"display_name_alternatives":["G. D. VIA","G. D. Via","G. David Via","G. Via","G.D Via","G.D. Via","GLEN D. VIA","Glen D Via","Glen D. Via","Glen David Via","Glen Via"],"block_key":"g via","works_api_url":"https://api.openalex.org/works?filter=author.id:A5079931455","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5079931455","updated_date":"2026-11-11T13:02:13","created_date":"2016-06-24T00:00:00"}