{"id":"https://openalex.org/A5078326554","orcid":"https://orcid.org/0009-0004-7773-4966","observed_orcids":["https://orcid.org/0009-0004-7773-4966"],"display_name":"B. Luo","raw_author_names":["B Luo","B. Luo"],"full_name":"Bingxue Luo","works_count":106,"cited_by_count":2579,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":29,"i10_index":53},"ids":{"openalex":"https://openalex.org/A5078326554","orcid":"https://orcid.org/0009-0004-7773-4966","observed_orcids":["https://orcid.org/0009-0004-7773-4966"]},"affiliations":[{"institution":{"id":"https://openalex.org/I166416128","ror":"https://ror.org/011hc8f90","display_name":"DEVCOM Army Research Laboratory","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437"]},"years":[2006]},{"institution":{"id":"https://openalex.org/I2250650973","ror":"https://ror.org/04w3jy968","display_name":"Samsung (South Korea)","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I33213144","ror":"https://ror.org/02y3ad647","display_name":"University of Florida","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]},"years":[2004,2003,2002,2001,2000]},{"institution":{"id":"https://openalex.org/I4405259277","ror":"https://ror.org/020m7t761","display_name":"Samsung Electronics (South Korea)","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973","https://openalex.org/I4405259277"]},"years":[2002]}],"last_known_institutions":[{"id":"https://openalex.org/I166416128","ror":"https://ror.org/011hc8f90","display_name":"DEVCOM Army Research Laboratory","country_code":"US","type":"government","lineage":["https://openalex.org/I1304082316","https://openalex.org/I1330347796","https://openalex.org/I166416128","https://openalex.org/I2802705668","https://openalex.org/I4210154437"]}],"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","count":83,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":75,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":46,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":40,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":11,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","value":0.000357,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","value":0.0003433,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","value":0.0001081,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":9.53e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":9.52e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9231653213500977},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.807098925113678},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.49449941515922546},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.35650354623794556},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.14426639676094055}],"counts_by_year":[{"year":2000,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":24,"oa_works_count":4,"cited_by_count":0},{"year":2002,"works_count":30,"oa_works_count":7,"cited_by_count":0},{"year":2003,"works_count":38,"oa_works_count":1,"cited_by_count":0},{"year":2004,"works_count":7,"oa_works_count":1,"cited_by_count":0},{"year":2006,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":132},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":150},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":80},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":103},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":75},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":66},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":67},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":72},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":61},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":62},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":58},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":40},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":52},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":45},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":20}],"display_name_alternatives":["B Luo","B. Luo"],"block_key":"b luo","works_api_url":"https://api.openalex.org/works?filter=author.id:A5078326554","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}