{"id":"https://openalex.org/A5077808100","orcid":null,"observed_orcids":[],"display_name":"Peter Meja","raw_author_names":["Meja, P.","Meja, Peter","P. Meja","Peter Meja"],"full_name":"Peter Meja","works_count":23,"cited_by_count":91,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5077808100","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I116397343","ror":"https://ror.org/024ga3r86","display_name":"Hochschule Mittweida","country_code":"DE","type":"education","lineage":["https://openalex.org/I116397343"]},"years":[1998,1997,1996,1995]},{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2002,1999]},{"institution":{"id":"https://openalex.org/I21491767","ror":"https://ror.org/035xkbk20","display_name":"Aix-Marseille Universit\u00e9","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I2610724","ror":"https://ror.org/00a208s56","display_name":"Chemnitz University of Technology","country_code":"DE","type":"education","lineage":["https://openalex.org/I2610724"]},"years":[1993]},{"institution":{"id":"https://openalex.org/I4210142713","ror":"https://ror.org/03zq0xc17","display_name":"Institut de Recherche sur les Ph\u00e9nom\u00e8nes Hors \u00c9quilibre","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210095849","https://openalex.org/I4210142713","https://openalex.org/I4210142724"]},"years":[2002,2000,1999]},{"institution":{"id":"https://openalex.org/I4387155462","ror":"https://ror.org/01qfjp710","display_name":"Lasers, Plasmas et Proc\u00e9d\u00e9s Photoniques","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4387155462"]},"years":[1999]}],"last_known_institutions":[{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I21491767","ror":"https://ror.org/035xkbk20","display_name":"Aix-Marseille Universit\u00e9","country_code":"FR","type":"education","lineage":["https://openalex.org/I21491767"]},{"id":"https://openalex.org/I4210142713","ror":"https://ror.org/03zq0xc17","display_name":"Institut de Recherche sur les Ph\u00e9nom\u00e8nes Hors \u00c9quilibre","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I21491767","https://openalex.org/I4210095849","https://openalex.org/I4210142713","https://openalex.org/I4210142724"]}],"topics":[{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","count":13,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13232","display_name":"Laser-Ablation Synthesis of Nanoparticles","count":8,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","count":6,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","count":5,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13232","display_name":"Laser-Ablation Synthesis of Nanoparticles","value":0.0001246,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","value":7.92e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","value":5.49e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","value":5.13e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","value":3.22e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8920475244522095},{"id":"520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","score":0.7749286890029907},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7051376104354858},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5893242359161377},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.43639999628067017}],"counts_by_year":[{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":1999,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Meja, P.","Meja, Peter","P. Meja","Peter Meja"],"block_key":"p meja","works_api_url":"https://api.openalex.org/works?filter=author.id:A5077808100","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}