{"id":"https://openalex.org/A5075520804","orcid":"https://orcid.org/0000-0003-3913-1043","observed_orcids":["https://orcid.org/0000-0003-3913-1043"],"display_name":"Stefan Hanna","raw_author_names":["S Hanna","S. HANNA","S. Hanna","Stefan Hanna"],"full_name":"Stefan Hanna","works_count":73,"cited_by_count":539,"summary_stats":{"2yr_mean_citedness":0.4,"h_index":12,"i10_index":18},"ids":{"openalex":"https://openalex.org/A5075520804","orcid":"https://orcid.org/0000-0003-3913-1043","observed_orcids":["https://orcid.org/0000-0003-3913-1043"]},"affiliations":[{"institution":{"id":"https://openalex.org/I177477856","ror":"https://ror.org/00bgk9508","display_name":"Politecnico di Torino","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]},"years":[2020]},{"institution":{"id":"https://openalex.org/I212220629","ror":"https://ror.org/02x91aj62","display_name":"Peter the Great St. Petersburg Polytechnic University","country_code":"RU","type":"education","lineage":["https://openalex.org/I212220629"]},"years":[2007]},{"institution":{"id":"https://openalex.org/I4210100607","ror":"https://ror.org/00n4jbh84","display_name":"Institute of Electronics, Computer and Telecommunication Engineering","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210100607","https://openalex.org/I4210155236"]},"years":[2021,2020]},{"institution":{"id":"https://openalex.org/I4210149772","ror":"https://ror.org/0406r4n88","display_name":"AIM Infrarot-Module (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210149772"]},"years":[2025,2024,2023,2022,2021,2020,2019,2018,2017,2016,2015,2013,2012,2011,2010,2009,2008]},{"institution":{"id":"https://openalex.org/I54009628","ror":"https://ror.org/0234wmv40","display_name":"University of Bayreuth","country_code":"DE","type":"education","lineage":["https://openalex.org/I54009628"]},"years":[2015,2009,2007,2006,2005,2004,2003]},{"institution":{"id":"https://openalex.org/I86501945","ror":"https://ror.org/01sbq1a82","display_name":"University of Delaware","country_code":"US","type":"education","lineage":["https://openalex.org/I86501945"]},"years":[2001]},{"institution":{"id":"https://openalex.org/I95568926","ror":"https://ror.org/05dkdaa55","display_name":"Ioffe Institute","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]},"years":[2007]}],"last_known_institutions":[{"id":"https://openalex.org/I4210149772","ror":"https://ror.org/0406r4n88","display_name":"AIM Infrarot-Module (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210149772"]}],"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":58,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","count":42,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","count":25,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","count":15,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","count":14,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","value":0.0008183,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","value":0.0002865,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":0.0002586,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","value":0.0001197,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":6.33e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7850657105445862},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7820116281509399},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6869335174560547},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6160869002342224},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6160054802894592}],"counts_by_year":[{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":5,"oa_works_count":2,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":5},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":9},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2015,"works_count":5,"oa_works_count":0,"cited_by_count":9},{"year":2016,"works_count":5,"oa_works_count":0,"cited_by_count":18},{"year":2017,"works_count":4,"oa_works_count":0,"cited_by_count":22},{"year":2018,"works_count":4,"oa_works_count":1,"cited_by_count":29},{"year":2019,"works_count":8,"oa_works_count":5,"cited_by_count":68},{"year":2020,"works_count":5,"oa_works_count":4,"cited_by_count":57},{"year":2021,"works_count":3,"oa_works_count":3,"cited_by_count":45},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":27},{"year":2023,"works_count":4,"oa_works_count":3,"cited_by_count":58},{"year":2024,"works_count":2,"oa_works_count":0,"cited_by_count":49},{"year":2025,"works_count":3,"oa_works_count":1,"cited_by_count":49},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":28}],"display_name_alternatives":["S Hanna","S. HANNA","S. Hanna","Stefan Hanna"],"block_key":"s hanna","works_api_url":"https://api.openalex.org/works?filter=author.id:A5075520804","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5075520804","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}