{"id":"https://openalex.org/A5074150508","orcid":"https://orcid.org/0000-0001-6508-7360","observed_orcids":["https://orcid.org/0000-0001-6508-7360"],"display_name":"Vineeta Kumari","raw_author_names":["Vineeta Kumari"],"full_name":"Vineeta Kumari","works_count":38,"cited_by_count":163,"summary_stats":{"2yr_mean_citedness":2.3333333333333335,"h_index":7,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5074150508","orcid":"https://orcid.org/0000-0001-6508-7360","observed_orcids":["https://orcid.org/0000-0001-6508-7360"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210098748","ror":"https://ror.org/0101xrq71","display_name":"Department of Science and Technology","country_code":"IN","type":"government","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210098748","https://openalex.org/I4210134808"]},"years":[2026,2025,2024]},{"institution":{"id":"https://openalex.org/I44635919","ror":"https://ror.org/032twef21","display_name":"National Institute of Technology Delhi","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210152752","https://openalex.org/I44635919"]},"years":[2024,2023,2022,2021,2020,2019,2018,2017]}],"last_known_institutions":[{"id":"https://openalex.org/I4210098748","ror":"https://ror.org/0101xrq71","display_name":"Department of Science and Technology","country_code":"IN","type":"government","lineage":["https://openalex.org/I2799351866","https://openalex.org/I4210098748","https://openalex.org/I4210134808"]}],"topics":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","count":13,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":12,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":12,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","count":10,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","value":0.0001803,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","value":9.96e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":7.96e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12452","display_name":"Electrowetting and Microfluidic Technologies","value":7.01e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","value":5.88e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8574000000953674},{"id":"187590223","wikidata":"https://www.wikidata.org/wiki/Q527628","display_name":"Holography","score":0.8543992042541504},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7553806900978088},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.6546469926834106},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.4072263538837433}],"counts_by_year":[{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2018,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2019,"works_count":4,"oa_works_count":2,"cited_by_count":8},{"year":2020,"works_count":2,"oa_works_count":2,"cited_by_count":8},{"year":2021,"works_count":7,"oa_works_count":2,"cited_by_count":23},{"year":2022,"works_count":9,"oa_works_count":0,"cited_by_count":19},{"year":2023,"works_count":4,"oa_works_count":1,"cited_by_count":16},{"year":2024,"works_count":2,"oa_works_count":0,"cited_by_count":26},{"year":2025,"works_count":2,"oa_works_count":1,"cited_by_count":39},{"year":2026,"works_count":2,"oa_works_count":1,"cited_by_count":24}],"display_name_alternatives":["Vineeta Kumari"],"block_key":"v kumari","works_api_url":"https://api.openalex.org/works?filter=author.id:A5074150508","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5074150508","updated_date":"2026-11-13T15:08:24","created_date":"2018-03-29T00:00:00"}