{"id":"https://openalex.org/A5073768310","orcid":null,"observed_orcids":[],"display_name":"Gabriel Blasquez","raw_author_names":["Blasquez, G","Blasquez, G.","G Blasquez","G. BLASQUEZ","G. Blasquez","G.A. Blasquez","Gabriel Blasquez"],"full_name":"Gabriel Blasquez","works_count":61,"cited_by_count":348,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":10,"i10_index":11},"ids":{"openalex":"https://openalex.org/A5073768310","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2005,2003,2002,2001,2000,1999,1998,1995,1994,1993,1992,1991,1988,1986,1980,1979,1978,1976,1974,1973,1972,1971]},{"institution":{"id":"https://openalex.org/I134560555","ror":"https://ror.org/02v6kpv12","display_name":"Universit\u00e9 Toulouse III - Paul Sabatier","country_code":"FR","type":"education","lineage":["https://openalex.org/I134560555","https://openalex.org/I4405258862"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I190497903","ror":"https://ror.org/03vcm6439","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I190497903","https://openalex.org/I193033237","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210152422","https://openalex.org/I4210159245","https://openalex.org/I4405258862","https://openalex.org/I4405259414"]},"years":[2005,2004,2003,2002,2001,2000,1999,1998,1996,1995,1994,1993,1992,1990,1987,1982,1980,1978,1977]},{"institution":{"id":"https://openalex.org/I33213144","ror":"https://ror.org/02y3ad647","display_name":"University of Florida","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]},"years":[1976]},{"institution":{"id":"https://openalex.org/I4405269201","ror":"https://ror.org/03czdsq06","display_name":"Centre de recherches math\u00e9matiques","country_code":"CA","type":"facility","lineage":["https://openalex.org/I4405269201","https://openalex.org/I70931966"]},"years":[1976]},{"institution":{"id":"https://openalex.org/I63966007","ror":"https://ror.org/042nb2s44","display_name":"Massachusetts Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]},"years":[1976]},{"institution":{"id":"https://openalex.org/I70931966","ror":"https://ror.org/0161xgx34","display_name":"Universit\u00e9 de Montr\u00e9al","country_code":"CA","type":"education","lineage":["https://openalex.org/I70931966"]},"years":[1976]}],"last_known_institutions":[{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I190497903","ror":"https://ror.org/03vcm6439","display_name":"Laboratoire d'Analyse et d'Architecture des Syst\u00e8mes","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I190497903","https://openalex.org/I193033237","https://openalex.org/I196454796","https://openalex.org/I205747304","https://openalex.org/I4210095849","https://openalex.org/I4210152422","https://openalex.org/I4210159245","https://openalex.org/I4405258862","https://openalex.org/I4405259414"]}],"topics":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","count":29,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":23,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","count":22,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","count":17,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":16,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","value":0.0001309,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","value":0.0001089,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","value":9.41e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":4.77e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","value":4.66e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7394523620605469},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7280182838439941},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6905470490455627},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.5671742558479309},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4462489187717438}],"counts_by_year":[{"year":1970,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1971,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1972,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1973,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1974,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1975,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1976,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1977,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1978,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":1979,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":1980,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":1982,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1986,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1987,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1988,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1990,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":6,"oa_works_count":6,"cited_by_count":0},{"year":2000,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":4}],"display_name_alternatives":["Blasquez, G","Blasquez, G.","G Blasquez","G. BLASQUEZ","G. Blasquez","G.A. Blasquez","Gabriel Blasquez"],"block_key":"g blasquez","works_api_url":"https://api.openalex.org/works?filter=author.id:A5073768310","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}