{"id":"https://openalex.org/A5073740298","orcid":null,"observed_orcids":[],"display_name":"Christoph von Kopylow","raw_author_names":["C. Kopylow","C. v. Kopylow","C. von Kopylow","C.v. Kopylow","Christoph Von Kopylow","Christoph v. Kopylow","Christoph v. Kopylow (3943646)","Christoph von Kopylow","Kopylow, Christoph V.","von Kopylow, Christoph"],"full_name":"von Kopylow, Christoph","works_count":97,"cited_by_count":1509,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":21,"i10_index":29},"ids":{"openalex":"https://openalex.org/A5073740298","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I189575948","ror":"https://ror.org/00jxshx33","display_name":"South Valley University","country_code":"EG","type":"education","lineage":["https://openalex.org/I189575948"]},"years":[2010]},{"institution":{"id":"https://openalex.org/I2801587597","ror":"https://ror.org/01k6z4z19","display_name":"Bremen Institute for Applied Beam Technology","country_code":"DE","type":"facility","lineage":["https://openalex.org/I2801587597"]},"years":[2014,2013,2012,2011,2010,2009,2008,2007,2006,2005,2004,2003]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":78,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","count":63,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","count":26,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","count":22,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":16,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","value":0.000628,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":0.0002612,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11408","display_name":"Advanced Optical Imaging Technologies","value":0.000174,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":0.0001384,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","value":0.0001009,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8878295421600342},{"id":"187590223","wikidata":"https://www.wikidata.org/wiki/Q527628","display_name":"Holography","score":0.8809980154037476},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8301070928573608},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8036061525344849},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5528650879859924}],"counts_by_year":[{"year":1998,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":7,"oa_works_count":2,"cited_by_count":0},{"year":2004,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":8,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":11,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":8,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":16,"oa_works_count":4,"cited_by_count":0},{"year":2011,"works_count":10,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":10,"oa_works_count":4,"cited_by_count":118},{"year":2013,"works_count":10,"oa_works_count":2,"cited_by_count":109},{"year":2014,"works_count":3,"oa_works_count":0,"cited_by_count":119},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":132},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":92},{"year":2017,"works_count":2,"oa_works_count":2,"cited_by_count":89},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":73},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":67},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":72},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":85},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":74},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":54},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":48},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":36}],"display_name_alternatives":["C. Kopylow","C. v. Kopylow","C. von Kopylow","C.v. Kopylow","Christoph Von Kopylow","Christoph v. Kopylow","Christoph v. Kopylow (3943646)","Christoph von Kopylow","Kopylow, Christoph V.","von Kopylow, Christoph"],"block_key":"c kopylow","works_api_url":"https://api.openalex.org/works?filter=author.id:A5073740298","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}