{"id":"https://openalex.org/A5073720136","orcid":"https://orcid.org/0009-0008-2068-5680","observed_orcids":["https://orcid.org/0009-0008-2068-5680"],"display_name":"Fernanda Saraiva","raw_author_names":["F Saraiva","F. Saraiva","Fernanda Saraiva","Saraiva Fernanda","Saraiva, Fernanda"],"full_name":"Fernanda Saraiva","works_count":30,"cited_by_count":64,"summary_stats":{"2yr_mean_citedness":1.125,"h_index":5,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5073720136","orcid":"https://orcid.org/0009-0008-2068-5680","observed_orcids":["https://orcid.org/0009-0008-2068-5680"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210103407","ror":"https://ror.org/0115xv923","display_name":"Swiss Federal Institute of Metrology","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]},"years":[2015]},{"institution":{"id":"https://openalex.org/I4210117046","ror":"https://ror.org/01pe22k85","display_name":"Instituto Portugu\u00eas Da Qualidade","country_code":"PT","type":"government","lineage":["https://openalex.org/I4210117046"]},"years":[2026,2025,2024,2023,2022,2020,2018,2017,2016,2015,2013,2010,2009,2007]},{"institution":{"id":"https://openalex.org/I883101600","ror":"https://ror.org/055vkyj43","display_name":"Bureau international des poids et mesures","country_code":"FR","type":"government","lineage":["https://openalex.org/I883101600"]},"years":[1995]}],"last_known_institutions":[{"id":"https://openalex.org/I4210117046","ror":"https://ror.org/01pe22k85","display_name":"Instituto Portugu\u00eas Da Qualidade","country_code":"PT","type":"government","lineage":["https://openalex.org/I4210117046"]}],"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":25,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":20,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":8,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10412","display_name":"Microfluidic and Capillary Electrophoresis Applications","count":5,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":0.0001131,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":0.0001101,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","value":7.65e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":6.92e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","value":4.51e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","score":0.8855000138282776},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.5865554809570312},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5667999982833862},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5346011519432068},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4380044937133789}],"counts_by_year":[{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":2,"oa_works_count":1,"cited_by_count":1},{"year":2015,"works_count":2,"oa_works_count":2,"cited_by_count":3},{"year":2016,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2018,"works_count":2,"oa_works_count":1,"cited_by_count":10},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2020,"works_count":2,"oa_works_count":2,"cited_by_count":5},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2023,"works_count":4,"oa_works_count":4,"cited_by_count":3},{"year":2024,"works_count":3,"oa_works_count":3,"cited_by_count":4},{"year":2025,"works_count":2,"oa_works_count":1,"cited_by_count":6},{"year":2026,"works_count":3,"oa_works_count":2,"cited_by_count":9}],"display_name_alternatives":["F Saraiva","F. Saraiva","Fernanda Saraiva","Saraiva Fernanda","Saraiva, Fernanda"],"block_key":"f saraiva","works_api_url":"https://api.openalex.org/works?filter=author.id:A5073720136","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}