{"id":"https://openalex.org/A5073602136","orcid":"https://orcid.org/0009-0002-5600-8485","observed_orcids":["https://orcid.org/0009-0002-5600-8485","https://orcid.org/0009-0000-8950-4261"],"display_name":"Yanru Ren","raw_author_names":["Minghui Liu","Y.-J. Ren","Y.-j. Ren","Y.\u2010J. Ren","Yanru Ren"],"full_name":"Yanru Ren","works_count":18,"cited_by_count":281,"summary_stats":{"2yr_mean_citedness":6.090909090909091,"h_index":6,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5073602136","orcid":"https://orcid.org/0009-0002-5600-8485","observed_orcids":["https://orcid.org/0009-0002-5600-8485","https://orcid.org/0009-0000-8950-4261"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1309532762","ror":"https://ror.org/017afst72","display_name":"Blackberry (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1309532762","https://openalex.org/I4210139826"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I2800710378","ror":"https://ror.org/056vyez31","display_name":"Naval University of Engineering","country_code":"CN","type":"education","lineage":["https://openalex.org/I2800710378"]},"years":[2026,2025,2024,2023]},{"institution":{"id":"https://openalex.org/I91045830","ror":"https://ror.org/01f5ytq51","display_name":"Texas A&M University","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]},"years":[2007,2006]},{"institution":{"id":"https://openalex.org/I921716337","ror":"https://ror.org/03net5943","display_name":"Northeast Petroleum University","country_code":"CN","type":"education","lineage":["https://openalex.org/I921716337"]},"years":[2024,2023]}],"last_known_institutions":[{"id":"https://openalex.org/I2800710378","ror":"https://ror.org/056vyez31","display_name":"Naval University of Engineering","country_code":"CN","type":"education","lineage":["https://openalex.org/I2800710378"]}],"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10069","display_name":"Antenna Design and Analysis","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11044","display_name":"Particle Detector Development and Performance","count":3,"subfield":{"id":"https://openalex.org/subfields/3106","display_name":"Nuclear and High Energy Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11359","display_name":"Effects of Radiation Exposure","count":3,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":5.18e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11392","display_name":"Energy Harvesting in Wireless Networks","value":3.9e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":1.41e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","value":1.39e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10069","display_name":"Antenna Design and Analysis","value":1.33e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7795616984367371},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.6608361601829529},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5711079835891724},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.4726390242576599},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3679888844490051}],"counts_by_year":[{"year":2006,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":18},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":21},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2023,"works_count":2,"oa_works_count":2,"cited_by_count":9},{"year":2024,"works_count":3,"oa_works_count":2,"cited_by_count":5},{"year":2025,"works_count":4,"oa_works_count":3,"cited_by_count":37},{"year":2026,"works_count":4,"oa_works_count":3,"cited_by_count":43}],"display_name_alternatives":["Minghui Liu","Y.-J. Ren","Y.-j. Ren","Y.\u2010J. Ren","Yanru Ren"],"block_key":"y ren","works_api_url":"https://api.openalex.org/works?filter=author.id:A5073602136","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5073602136","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}