{"id":"https://openalex.org/A5073201808","orcid":"https://orcid.org/0000-0002-9153-0634","observed_orcids":["https://orcid.org/0000-0002-9153-0634"],"display_name":"Fernando A. Fardo","raw_author_names":["Fardo, F. A.","Fardo, Fernando A.","Fernando A. Fardo","Fernando Azevedo Fardo","Fernando Fardo"],"full_name":"Fernando Azevedo Fardo","works_count":5,"cited_by_count":121,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":2,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5073201808","orcid":"https://orcid.org/0000-0002-9153-0634","observed_orcids":["https://orcid.org/0000-0002-9153-0634"]},"affiliations":[{"institution":{"id":"https://openalex.org/I139221136","ror":"https://ror.org/007kf5222","display_name":"Centro Universit\u00e1rio FEI","country_code":"BR","type":"education","lineage":["https://openalex.org/I139221136"]},"years":[2023,2018,2016]}],"last_known_institutions":[{"id":"https://openalex.org/I139221136","ror":"https://ror.org/007kf5222","display_name":"Centro Universit\u00e1rio FEI","country_code":"BR","type":"education","lineage":["https://openalex.org/I139221136"]}],"topics":[{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":2,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","value":1.66e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","value":9.7e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":9.3e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","value":7.6e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","value":6e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7828126549720764},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7202479839324951},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.48018208146095276},{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.47487542033195496},{"id":"115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","score":0.47025004029273987}],"counts_by_year":[{"year":2015,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2016,"works_count":1,"oa_works_count":1,"cited_by_count":1},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":12},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":9},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":29},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":31}],"display_name_alternatives":["Fardo, F. A.","Fardo, Fernando A.","Fernando A. Fardo","Fernando Azevedo Fardo","Fernando Fardo"],"block_key":"f fardo","works_api_url":"https://api.openalex.org/works?filter=author.id:A5073201808","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}