{"id":"https://openalex.org/A5069718934","orcid":null,"observed_orcids":[],"display_name":"Luis Felipe Giles","raw_author_names":["Giles Antunez de Mayolo, Luis Felipe","L F Giles","L. F. GILES","L. F. Giles","L.F Giles","L.F. Giles","Luis Felipe GILES","Luis Felipe Giles"],"full_name":"Luis Felipe Giles","works_count":27,"cited_by_count":284,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5069718934","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2001,2000,1999]},{"institution":{"id":"https://openalex.org/I137594350","ror":"https://ror.org/005kw6t15","display_name":"Infineon Technologies (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]},"years":[2008,2006,2005]},{"institution":{"id":"https://openalex.org/I2251713219","ror":"https://ror.org/00berct97","display_name":"NTT (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]},"years":[1999,1996]},{"institution":{"id":"https://openalex.org/I28290843","ror":"https://ror.org/00ks66431","display_name":"University of Surrey","country_code":"GB","type":"education","lineage":["https://openalex.org/I28290843"]},"years":[2005,2002,1996,1995,1994,1993,1992]},{"institution":{"id":"https://openalex.org/I4210089806","ror":"https://ror.org/0095xwr23","display_name":"Max Planck Institute of Microstructure Physics","country_code":"DE","type":"facility","lineage":["https://openalex.org/I149899117","https://openalex.org/I4210089806"]},"years":[2000]},{"institution":{"id":"https://openalex.org/I4210105847","ror":"https://ror.org/01m2pas06","display_name":"NTT Basic Research Laboratories","country_code":"JP","type":"facility","lineage":["https://openalex.org/I4210105847"]},"years":[1999]},{"institution":{"id":"https://openalex.org/I4210135147","ror":"https://ror.org/03kwnqq69","display_name":"Centre d\u2019\u00c9laboration de Mat\u00e9riaux et d\u2019\u00c9tudes Structurales","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I196454796","https://openalex.org/I4210098836","https://openalex.org/I4210135147","https://openalex.org/I4405258862"]},"years":[2001,2000,1999]},{"institution":{"id":"https://openalex.org/I4210149211","ror":"https://ror.org/048dd0611","display_name":"Institute of Semiconductors","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210149211"]},"years":[1992]}],"last_known_institutions":[{"id":"https://openalex.org/I137594350","ror":"https://ror.org/005kw6t15","display_name":"Infineon Technologies (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":26,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":25,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","count":14,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":10,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","value":5.89e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":5.26e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":5.18e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":1.11e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","value":1.1e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9045018553733826},{"id":"544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","score":0.7706654071807861},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5503845810890198},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.3985079526901245},{"id":"178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","score":0.08383381366729736}],"counts_by_year":[{"year":1990,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1999,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":2000,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Giles Antunez de Mayolo, Luis Felipe","L F Giles","L. F. GILES","L. F. Giles","L.F Giles","L.F. Giles","Luis Felipe GILES","Luis Felipe Giles"],"block_key":"l giles","works_api_url":"https://api.openalex.org/works?filter=author.id:A5069718934","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}