{"id":"https://openalex.org/A5069339092","orcid":null,"observed_orcids":[],"display_name":"Dieter Schaefer","raw_author_names":["D. A. Schaefer","D. Schaefer","D.A. Schaefer","Dieter Schaefer","Schaefer, D."],"full_name":"Dieter Schaefer","works_count":16,"cited_by_count":112,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5069339092","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1313323035","ror":"https://ror.org/05qrfxd25","display_name":"Russian Academy of Sciences","country_code":"RU","type":"government","lineage":["https://openalex.org/I1313323035"]},"years":[1995]},{"institution":{"id":"https://openalex.org/I160414472","ror":"https://ror.org/000q08p21","display_name":"Schott (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I160414472"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I197524780","ror":"https://ror.org/0176aa147","display_name":"Petrozavodsk State University","country_code":"RU","type":"education","lineage":["https://openalex.org/I197524780"]},"years":[1995]},{"institution":{"id":"https://openalex.org/I4210102034","ror":"https://ror.org/01gkym270","display_name":"Laser Zentrum Hannover","country_code":"DE","type":"nonprofit","lineage":["https://openalex.org/I4210102034"]},"years":[2004]},{"institution":{"id":"https://openalex.org/I4322298","ror":"https://ror.org/044w7a341","display_name":"Towson University","country_code":"US","type":"education","lineage":["https://openalex.org/I4322298"]},"years":[2007,1996,1995]},{"institution":{"id":"https://openalex.org/I75951250","ror":"https://ror.org/046ak2485","display_name":"Freie Universit\u00e4t Berlin","country_code":"DE","type":"education","lineage":["https://openalex.org/I75951250"]},"years":[1992]}],"last_known_institutions":[{"id":"https://openalex.org/I4322298","ror":"https://ror.org/044w7a341","display_name":"Towson University","country_code":"US","type":"education","lineage":["https://openalex.org/I4322298"]}],"topics":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","count":12,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":5,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","value":0.0001027,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":4.33e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","value":4.22e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","value":2.97e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11128","display_name":"Transition Metal Oxide Nanomaterials","value":1.78e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8811894655227661},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.6792929768562317},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5195981860160828},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.3700593113899231},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.19580456614494324}],"counts_by_year":[{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["D. A. Schaefer","D. Schaefer","D.A. Schaefer","Dieter Schaefer","Schaefer, D."],"block_key":"d schaefer","works_api_url":"https://api.openalex.org/works?filter=author.id:A5069339092","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}