{"id":"https://openalex.org/A5068464369","orcid":null,"observed_orcids":[],"display_name":"Steven Dzioba","raw_author_names":["Dzioba, Steven","S. DZIOBA","S. Dzioba","Steven Dzioba"],"full_name":"Steven Dzioba","works_count":25,"cited_by_count":404,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":12,"i10_index":15},"ids":{"openalex":"https://openalex.org/A5068464369","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I153908563","ror":"https://ror.org/03rz4pm90","display_name":"Nortel (Canada)","country_code":"CA","type":"company","lineage":["https://openalex.org/I153908563"]},"years":[1999]},{"institution":{"id":"https://openalex.org/I176714629","ror":"https://ror.org/00xdg8m59","display_name":"Bell (Canada)","country_code":"CA","type":"company","lineage":["https://openalex.org/I176714629"]},"years":[1994,1993,1989,1988,1987,1986,1984,1982,1981,1980]},{"institution":{"id":"https://openalex.org/I4210114115","ror":"https://ror.org/0265w5591","display_name":"IBM Research - Thomas J. Watson Research Center","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},"years":[1981,1980]},{"institution":{"id":"https://openalex.org/I98251732","ror":"https://ror.org/02fa3aq29","display_name":"McMaster University","country_code":"CA","type":"education","lineage":["https://openalex.org/I98251732"]},"years":[1980,1979,1978]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":13,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10781","display_name":"Low-Pressure Plasma Processing and Diagnostics","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10523","display_name":"Atomic and Molecular Physics","count":6,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":3.71e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":2.09e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":1.98e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":1.66e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","value":1.64e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.9726518988609314},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8744585514068604},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6208153963088989},{"id":"171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","score":0.36021602153778076},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.2764190137386322}],"counts_by_year":[{"year":1978,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1979,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1980,"works_count":6,"oa_works_count":1,"cited_by_count":0},{"year":1981,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1982,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1984,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1986,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1987,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1988,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["Dzioba, Steven","S. DZIOBA","S. Dzioba","Steven Dzioba"],"block_key":"s dzioba","works_api_url":"https://api.openalex.org/works?filter=author.id:A5068464369","updated_date":"2026-10-31T12:29:50","created_date":"2016-06-24T00:00:00"}