{"id":"https://openalex.org/A5068327214","orcid":null,"observed_orcids":[],"display_name":"Klaus Miethe","raw_author_names":["K Miethe","K. Miethe","Klaus Miethe"],"full_name":"Klaus Miethe","works_count":15,"cited_by_count":70,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5068327214","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I200763008","ror":"https://ror.org/033eqas34","display_name":"Justus-Liebig-Universit\u00e4t Gie\u00dfen","country_code":"DE","type":"education","lineage":["https://openalex.org/I200763008"]},"years":[1982,1979]},{"institution":{"id":"https://openalex.org/I2802562207","ror":"https://ror.org/0150tj573","display_name":"Deutsche Bundespost","country_code":"DE","type":"government","lineage":["https://openalex.org/I2802562207"]},"years":[1995,1994,1993,1991,1989,1987,1986]},{"institution":{"id":"https://openalex.org/I4210093367","ror":"https://ror.org/00m8prc86","display_name":"Deutsche Telekom (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210093367"]},"years":[2002,1996]}],"last_known_institutions":[{"id":"https://openalex.org/I4210093367","ror":"https://ror.org/00m8prc86","display_name":"Deutsche Telekom (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210093367"]}],"topics":[{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","count":11,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":9,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","value":3.91e-05,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":2.09e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":1.82e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12166","display_name":"Ion-surface interactions and analysis","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","value":8.8e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","score":0.8493739366531372},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7250309586524963},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.6404663324356079},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3799298107624054},{"id":"178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","score":0.0}],"counts_by_year":[{"year":1979,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1982,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1986,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1987,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["K Miethe","K. Miethe","Klaus Miethe"],"block_key":"k miethe","works_api_url":"https://api.openalex.org/works?filter=author.id:A5068327214","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}