{"id":"https://openalex.org/A5065864242","orcid":"https://orcid.org/0000-0001-7597-8298","observed_orcids":["https://orcid.org/0000-0001-7597-8298"],"display_name":"Tongzhen Xing","raw_author_names":["Tongzhen XING","Tongzhen Xing"],"full_name":"Tongzhen Xing","works_count":21,"cited_by_count":157,"summary_stats":{"2yr_mean_citedness":3.090909090909091,"h_index":9,"i10_index":6},"ids":{"openalex":"https://openalex.org/A5065864242","orcid":"https://orcid.org/0000-0001-7597-8298","observed_orcids":["https://orcid.org/0000-0001-7597-8298"]},"affiliations":[{"institution":{"id":"https://openalex.org/I125839683","ror":"https://ror.org/01skt4w74","display_name":"Beijing Institute of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]},"years":[2021,2020,2019]},{"institution":{"id":"https://openalex.org/I183067930","ror":"https://ror.org/0220qvk04","display_name":"Shanghai Jiao Tong University","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]},"years":[2024,2023]},{"institution":{"id":"https://openalex.org/I99065089","ror":"https://ror.org/03cve4549","display_name":"Tsinghua University","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]},"years":[2024]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":8,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":7,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":7,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":6,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10161","display_name":"Rock Mechanics and Modeling","count":6,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":3.53e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":3.24e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":2.67e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13465","display_name":"Graphite, nuclear technology, radiation studies","value":2.48e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10161","display_name":"Rock Mechanics and Modeling","value":1.87e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.859601616859436},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.8434278964996338},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7808570861816406},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7433000206947327},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3518267869949341}],"counts_by_year":[{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2020,"works_count":4,"oa_works_count":3,"cited_by_count":4},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2022,"works_count":2,"oa_works_count":2,"cited_by_count":17},{"year":2023,"works_count":2,"oa_works_count":0,"cited_by_count":11},{"year":2024,"works_count":5,"oa_works_count":3,"cited_by_count":30},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":40},{"year":2026,"works_count":5,"oa_works_count":3,"cited_by_count":51}],"display_name_alternatives":["Tongzhen XING","Tongzhen Xing"],"block_key":"t xing","works_api_url":"https://api.openalex.org/works?filter=author.id:A5065864242","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5065864242","updated_date":"2026-11-12T13:17:38","created_date":"2019-12-26T00:00:00"}