{"id":"https://openalex.org/A5064889793","orcid":null,"observed_orcids":[],"display_name":"Tainara Pedrosa de Lima","raw_author_names":["Lima, Tainara Pedrosa de","Tainara  Pedrosa de Lima","Tainara P. Lima","Tainara P. de Lima","Tainara Pedrosa","Tainara Pedrosa de Lima"],"full_name":"Tainara  Pedrosa de Lima","works_count":7,"cited_by_count":0,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":0,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5064889793","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I4104125","ror":"https://ror.org/041akq887","display_name":"Universidade Federal de Santa Catarina","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]},"years":[2026,2025,2023]}],"last_known_institutions":[{"id":"https://openalex.org/I4104125","ror":"https://ror.org/041akq887","display_name":"Universidade Federal de Santa Catarina","country_code":"BR","type":"education","lineage":["https://openalex.org/I4104125"]}],"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","count":3,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10205","display_name":"Advanced Fiber Optic Sensors","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10396","display_name":"Fatigue and fracture mechanics","count":1,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","value":3.81e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11897","display_name":"Digital Holography and Microscopy","value":2.9e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":2.26e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":8.3e-06,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12106","display_name":"Surface Treatment and Residual Stress","value":7.6e-06,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"138246806","wikidata":"https://www.wikidata.org/wiki/Q638475","display_name":"Shearography","score":0.9425567388534546},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6063573360443115},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.5591240525245667},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.5063654184341431},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3111596703529358}],"counts_by_year":[{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2023,"works_count":3,"oa_works_count":2,"cited_by_count":0},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":0}],"display_name_alternatives":["Lima, Tainara Pedrosa de","Tainara  Pedrosa de Lima","Tainara P. Lima","Tainara P. de Lima","Tainara Pedrosa","Tainara Pedrosa de Lima"],"block_key":"t lima","works_api_url":"https://api.openalex.org/works?filter=author.id:A5064889793","updated_date":"2026-10-15T12:44:11","created_date":"2025-10-10T00:00:00"}