{"id":"https://openalex.org/A5064488667","orcid":"https://orcid.org/0000-0002-1776-1733","observed_orcids":["https://orcid.org/0000-0002-1776-1733"],"display_name":"Jithendra P R Nayak","raw_author_names":["Jithendra P R Nayak","Jithendra P. R. Nayak","Jithendra P.R. Nayak"],"full_name":"Jithendra P. R. Nayak","works_count":12,"cited_by_count":140,"summary_stats":{"2yr_mean_citedness":2.0,"h_index":4,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5064488667","orcid":"https://orcid.org/0000-0002-1776-1733","observed_orcids":["https://orcid.org/0000-0002-1776-1733"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210106304","ror":"https://ror.org/01hmsgz49","display_name":"Krishi Vigyan Kendra, Latur","country_code":"IN","type":"education","lineage":["https://openalex.org/I179420787","https://openalex.org/I4210106304"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I4405252405","ror":"https://ror.org/019qzkn95","display_name":"Srinivas University","country_code":"IN","type":"education","lineage":["https://openalex.org/I4405252405"]},"years":[2025]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":6,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":4,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","count":4,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10230","display_name":"Marine and fisheries research","count":2,"subfield":{"id":"https://openalex.org/subfields/1104","display_name":"Aquatic Science"},"field":{"id":"https://openalex.org/fields/11","display_name":"Agricultural and Biological Sciences"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T10255","display_name":"Oceanographic and Atmospheric Processes","count":2,"subfield":{"id":"https://openalex.org/subfields/1910","display_name":"Oceanography"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":2.77e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","value":2.21e-05,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","value":1.94e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14189","display_name":"Intravenous Infusion Technology and Safety","value":1.5e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13248","display_name":"Healthcare Technology and Patient Monitoring","value":1.49e-05,"subfield":{"id":"https://openalex.org/subfields/2746","display_name":"Surgery"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8831170201301575},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.82669997215271},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.6621000170707703},{"id":"119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","score":0.5354934334754944},{"id":"111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","score":0.0}],"counts_by_year":[{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2017,"works_count":3,"oa_works_count":2,"cited_by_count":1},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":5},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":30},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":62},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":15},{"year":2025,"works_count":2,"oa_works_count":2,"cited_by_count":9},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":12}],"display_name_alternatives":["Jithendra P R Nayak","Jithendra P. R. Nayak","Jithendra P.R. Nayak"],"block_key":"j nayak","works_api_url":"https://api.openalex.org/works?filter=author.id:A5064488667","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5064488667","updated_date":"2026-11-14T11:48:19","created_date":"2016-06-24T00:00:00"}