{"id":"https://openalex.org/A5064322830","orcid":null,"observed_orcids":[],"display_name":"Tino Heijmen","raw_author_names":["Heijmen, TGA","T. Heijmen","TINO HEIJMEN","Tino Heijmen"],"full_name":"Tino Heijmen","works_count":17,"cited_by_count":620,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":11,"i10_index":12},"ids":{"openalex":"https://openalex.org/A5064322830","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I109147379","ror":"https://ror.org/059be4e97","display_name":"NXP (Netherlands)","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]},"years":[2008,2007]},{"institution":{"id":"https://openalex.org/I4210122849","ror":"https://ror.org/02p2bgp27","display_name":"Philips (Netherlands)","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210122849"]},"years":[2006,2005,2004]},{"institution":{"id":"https://openalex.org/I4210163196","ror":"https://ror.org/0532vdr17","display_name":"Signify (Netherlands)","country_code":"NL","type":"company","lineage":["https://openalex.org/I4210163196"]},"years":[2005]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":14,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","count":9,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":9,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10002","display_name":"Advanced Chemical Physics Studies","count":1,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":0.0001212,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":9.92e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":9.4e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","value":3.17e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":1.61e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","score":0.9163550734519958},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.624911367893219},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.5683000087738037},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.49507609009742737},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4170229136943817}],"counts_by_year":[{"year":1996,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":38},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":31},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":50},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":41},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":32},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":19},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":8}],"display_name_alternatives":["Heijmen, TGA","T. Heijmen","TINO HEIJMEN","Tino Heijmen"],"block_key":"t heijmen","works_api_url":"https://api.openalex.org/works?filter=author.id:A5064322830","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}