{"id":"https://openalex.org/A5063405390","orcid":null,"observed_orcids":[],"display_name":"Jack Little","raw_author_names":["J. R. Little","Jack Little","Jack R. Little","Jack R. Little Jr.","Little Jack"],"full_name":"Jack R. Little Jr.","works_count":17,"cited_by_count":42,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":4,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5063405390","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1282105669","ror":"https://ror.org/05gvnxz63","display_name":"Argonne National Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1282105669","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I40347166"]},"years":[2010,2009]},{"institution":{"id":"https://openalex.org/I4210089476","ror":"https://ror.org/006tfee03","display_name":"Evisive (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210089476"]},"years":[2015,2013,2011,2010,2009]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":17,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","count":17,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","count":9,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","count":3,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","count":2,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":0.0001128,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","value":8.26e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","value":2.78e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","value":2.4e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","value":1.5e-05,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","score":0.8318718075752258},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.821563720703125},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.5446069836616516},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.48253485560417175},{"id":"76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","score":0.2500483989715576}],"counts_by_year":[{"year":2009,"works_count":5,"oa_works_count":2,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2011,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2013,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":5}],"display_name_alternatives":["J. R. Little","Jack Little","Jack R. Little","Jack R. Little Jr.","Little Jack"],"block_key":"j little","works_api_url":"https://api.openalex.org/works?filter=author.id:A5063405390","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}