{"id":"https://openalex.org/A5062467440","orcid":null,"observed_orcids":[],"display_name":"Michael Hermann","raw_author_names":["Michael Hermann"],"full_name":"Michael Hermann","works_count":2,"cited_by_count":35,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":2,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5062467440","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I62916508","ror":"https://ror.org/02kkvpp62","display_name":"Technical University of Munich","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]},"years":[1999,1994]}],"last_known_institutions":[{"id":"https://openalex.org/I62916508","ror":"https://ror.org/02kkvpp62","display_name":"Technical University of Munich","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":1,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":1,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11437","display_name":"Digital Platforms and Economics","count":1,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11499","display_name":"ICT Impact and Policies","count":1,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":1e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":8.3e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11437","display_name":"Digital Platforms and Economics","value":8e-06,"subfield":{"id":"https://openalex.org/subfields/1408","display_name":"Strategy and Management"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13066","display_name":"Information Society and Technology Trends","value":5.7e-06,"subfield":{"id":"https://openalex.org/subfields/3300","display_name":"General Social Sciences"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","value":4.3e-06,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","score":0.6145747303962708},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.37460145354270935},{"id":"113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","score":0.34442752599716187},{"id":"111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","score":0.0},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.0}],"counts_by_year":[{"year":1994,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["Michael Hermann"],"block_key":"m hermann","works_api_url":"https://api.openalex.org/works?filter=author.id:A5062467440","updated_date":"2026-10-27T12:30:23","created_date":"2016-06-24T00:00:00"}