{"id":"https://openalex.org/A5062357005","orcid":"https://orcid.org/0000-0003-0666-6199","observed_orcids":["https://orcid.org/0000-0003-0666-6199"],"display_name":"Dmitry A. Maevsky","raw_author_names":["D. A. Maevsky","D. A. Maevsky,","D. Maevsky","D.A. Maevsky","Dmitro Maevsky","Dmitry A. Maevsky","Dmitry Maevsky","Maevsky Dmitry","Maevsky, Dmitry"],"full_name":"Dmitry A. Maevsky","works_count":46,"cited_by_count":153,"summary_stats":{"2yr_mean_citedness":0.1111111111111111,"h_index":7,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5062357005","orcid":"https://orcid.org/0000-0003-0666-6199","observed_orcids":["https://orcid.org/0000-0003-0666-6199"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1316184350","ror":"https://ror.org/03bra4w96","display_name":"Ministry of Education and Science","country_code":"UA","type":"government","lineage":["https://openalex.org/I1316184350"]},"years":[2020]},{"institution":{"id":"https://openalex.org/I40179345","ror":"https://ror.org/05xaz0w84","display_name":"Odes\u0430 Polytechnic National University","country_code":"UA","type":"education","lineage":["https://openalex.org/I40179345"]},"years":[2026,2025,2024,2023,2022,2021,2020,2019,2018,2017,2016,2014,2013,1958]}],"last_known_institutions":[{"id":"https://openalex.org/I40179345","ror":"https://ror.org/05xaz0w84","display_name":"Odes\u0430 Polytechnic National University","country_code":"UA","type":"education","lineage":["https://openalex.org/I40179345"]}],"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":15,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","count":14,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","count":9,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14311","display_name":"Electrical and Electromagnetic Research","count":6,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","value":0.0001792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12238","display_name":"Green IT and Sustainability","value":7.17e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","value":4.11e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","value":3.9e-05,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","value":3.69e-05,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7443410158157349},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6195999979972839},{"id":"163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","score":0.569231390953064},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.39719998836517334},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.13877242803573608}],"counts_by_year":[{"year":1958,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":2,"cited_by_count":1},{"year":2013,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2014,"works_count":6,"oa_works_count":4,"cited_by_count":3},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2017,"works_count":5,"oa_works_count":2,"cited_by_count":14},{"year":2018,"works_count":6,"oa_works_count":2,"cited_by_count":34},{"year":2019,"works_count":3,"oa_works_count":1,"cited_by_count":16},{"year":2020,"works_count":3,"oa_works_count":3,"cited_by_count":28},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":15},{"year":2022,"works_count":3,"oa_works_count":2,"cited_by_count":10},{"year":2023,"works_count":2,"oa_works_count":1,"cited_by_count":7},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":7},{"year":2025,"works_count":2,"oa_works_count":2,"cited_by_count":6},{"year":2026,"works_count":6,"oa_works_count":6,"cited_by_count":4}],"display_name_alternatives":["D. A. Maevsky","D. A. Maevsky,","D. Maevsky","D.A. Maevsky","Dmitro Maevsky","Dmitry A. Maevsky","Dmitry Maevsky","Maevsky Dmitry","Maevsky, Dmitry"],"block_key":"d maevsky","works_api_url":"https://api.openalex.org/works?filter=author.id:A5062357005","updated_date":"2026-10-29T12:27:34","created_date":"2016-06-24T00:00:00"}