{"id":"https://openalex.org/A5060766516","orcid":"https://orcid.org/0000-0001-5957-5501","observed_orcids":["https://orcid.org/0000-0001-5957-5501"],"display_name":"E Prieto","raw_author_names":["E Prieto","E. Prieto","Emilio Prieto","Prieto, Emilio"],"full_name":"Prieto, Emilio, 1940-","works_count":36,"cited_by_count":201,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":7,"i10_index":5},"ids":{"openalex":"https://openalex.org/A5060766516","orcid":"https://orcid.org/0000-0001-5957-5501","observed_orcids":["https://orcid.org/0000-0001-5957-5501"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210111132","ror":"https://ror.org/022r8xe61","display_name":"Centro Espa\u00f1ol de Metrolog\u00eda","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210111132"]},"years":[2024,2022,2021,2020,2018,2017,2016,2015,2014,2012,2011,2007,2006,2003,2002]},{"institution":{"id":"https://openalex.org/I883101600","ror":"https://ror.org/055vkyj43","display_name":"Bureau international des poids et mesures","country_code":"FR","type":"government","lineage":["https://openalex.org/I883101600"]},"years":[1995]}],"last_known_institutions":[{"id":"https://openalex.org/I4210111132","ror":"https://ror.org/022r8xe61","display_name":"Centro Espa\u00f1ol de Metrolog\u00eda","country_code":"ES","type":"other","lineage":["https://openalex.org/I4210111132"]}],"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":32,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":28,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":13,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","count":7,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":0.000154,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":0.0001446,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12004","display_name":"Advanced Frequency and Time Standards","value":0.0001071,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":4.74e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":4.35e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.6921170949935913},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.6331838965415955},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6024316549301147},{"id":"105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","score":0.5296993851661682},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.4837903678417206}],"counts_by_year":[{"year":1960,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":1995,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":1,"cited_by_count":7},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":8},{"year":2015,"works_count":1,"oa_works_count":1,"cited_by_count":5},{"year":2016,"works_count":2,"oa_works_count":1,"cited_by_count":10},{"year":2017,"works_count":4,"oa_works_count":1,"cited_by_count":6},{"year":2018,"works_count":2,"oa_works_count":2,"cited_by_count":7},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2020,"works_count":4,"oa_works_count":1,"cited_by_count":16},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2022,"works_count":4,"oa_works_count":2,"cited_by_count":8},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":11},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":10}],"display_name_alternatives":["E Prieto","E. Prieto","Emilio Prieto","Prieto, Emilio"],"block_key":"e prieto","works_api_url":"https://api.openalex.org/works?filter=author.id:A5060766516","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}