{"id":"https://openalex.org/A5060714231","orcid":"https://orcid.org/0000-0002-8992-7691","observed_orcids":["https://orcid.org/0000-0002-8992-7691"],"display_name":"Beomsik Kim","raw_author_names":["Beom-Sik Kim","Beomsik Kim","Kim, Beomsik"],"full_name":"Kim, Beomsik","works_count":19,"cited_by_count":73,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5060714231","orcid":"https://orcid.org/0000-0002-8992-7691","observed_orcids":["https://orcid.org/0000-0002-8992-7691"]},"affiliations":[{"institution":{"id":"https://openalex.org/I165507594","ror":"https://ror.org/01mh5ph17","display_name":"Kangwon National University","country_code":"KR","type":"education","lineage":["https://openalex.org/I165507594"]},"years":[2026]},{"institution":{"id":"https://openalex.org/I193775966","ror":"https://ror.org/01wjejq96","display_name":"Yonsei University","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]},"years":[2021]},{"institution":{"id":"https://openalex.org/I2250650973","ror":"https://ror.org/04w3jy968","display_name":"Samsung (South Korea)","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]},"years":[2005]},{"institution":{"id":"https://openalex.org/I4210151417","ror":"https://ror.org/043k4kk20","display_name":"Korea Research Institute of Chemical Technology","country_code":"KR","type":"facility","lineage":["https://openalex.org/I4210151417"]},"years":[2013,2012]},{"institution":{"id":"https://openalex.org/I57664883","ror":"https://ror.org/03tzb2h73","display_name":"Ajou University","country_code":"KR","type":"education","lineage":["https://openalex.org/I57664883"]},"years":[2020,2019]},{"institution":{"id":"https://openalex.org/I67900169","ror":"https://ror.org/01r024a98","display_name":"Chung-Ang University","country_code":"KR","type":"education","lineage":["https://openalex.org/I67900169"]},"years":[2021]}],"last_known_institutions":[{"id":"https://openalex.org/I165507594","ror":"https://ror.org/01mh5ph17","display_name":"Kangwon National University","country_code":"KR","type":"education","lineage":["https://openalex.org/I165507594"]}],"topics":[{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","count":3,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","count":2,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","count":2,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10967","display_name":"Carbon Dioxide Capture Technologies","count":2,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10933","display_name":"Real-Time Systems Scheduling","value":2.24e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":1.66e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10967","display_name":"Carbon Dioxide Capture Technologies","value":1.31e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11593","display_name":"Carbon dioxide utilization in catalysis","value":9.9e-06,"subfield":{"id":"https://openalex.org/subfields/1508","display_name":"Process Chemistry and Technology"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","value":9.6e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.9303150177001953},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6906958222389221},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.6711353063583374},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.22083041071891785},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.17084509134292603}],"counts_by_year":[{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2013,"works_count":4,"oa_works_count":2,"cited_by_count":1},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":2},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2020,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2021,"works_count":3,"oa_works_count":1,"cited_by_count":4},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":10},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":3}],"display_name_alternatives":["Beom-Sik Kim","Beomsik Kim","Kim, Beomsik"],"block_key":"b kim","works_api_url":"https://api.openalex.org/works?filter=author.id:A5060714231","updated_date":"2026-10-28T12:34:19","created_date":"2016-06-24T00:00:00"}