{"id":"https://openalex.org/A5052188490","orcid":null,"observed_orcids":[],"display_name":"G. Ang\u00e9nieux","raw_author_names":["Ang\u00e9nieux, G.","G Ang\u00e9nieux","G. Angenieux","G. Ange\u0301nieux","G. Ang\u00e9nieux","Gilbert Angenieux"],"full_name":"Angenieux, Gilbert","works_count":47,"cited_by_count":214,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":8,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5052188490","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I106785703","ror":"https://ror.org/05sbt2524","display_name":"Institut polytechnique de Grenoble","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},"years":[2019,2001,1999]},{"institution":{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},"years":[2019]},{"institution":{"id":"https://openalex.org/I4210139715","ror":"https://ror.org/03taa9n66","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]},"years":[2019,2018,2001,1999]},{"institution":{"id":"https://openalex.org/I4210144791","ror":"https://ror.org/04dbzz632","display_name":"Institut N\u00e9el","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210098836","https://openalex.org/I4210144791","https://openalex.org/I899635006"]},"years":[2001,1999]},{"institution":{"id":"https://openalex.org/I4400573202","ror":"https://ror.org/050rs7291","display_name":"Centre de Radiofr\u00e9quences, Optique et Micro-nano\u00e9lectronique des Alpes","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4400573202","https://openalex.org/I70900168","https://openalex.org/I899635006"]},"years":[2019,2018,2001,1999]},{"institution":{"id":"https://openalex.org/I70900168","ror":"https://ror.org/04gqg1a07","display_name":"Universit\u00e9 Savoie Mont Blanc","country_code":"FR","type":"education","lineage":["https://openalex.org/I70900168"]},"years":[2019,2008,2006,2005,2003,2002,2001,2000,1999,1996,1995,1994,1993]}],"last_known_institutions":[{"id":"https://openalex.org/I106785703","ror":"https://ror.org/05sbt2524","display_name":"Institut polytechnique de Grenoble","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","ror":"https://ror.org/02feahw73","display_name":"Centre National de la Recherche Scientifique","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210139715","ror":"https://ror.org/03taa9n66","display_name":"Institut de Micro\u00e9lectronique, Electromagn\u00e9tisme et Photonique","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210095849","https://openalex.org/I4210139715","https://openalex.org/I70900168","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I4400573202","ror":"https://ror.org/050rs7291","display_name":"Centre de Radiofr\u00e9quences, Optique et Micro-nano\u00e9lectronique des Alpes","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4400573202","https://openalex.org/I70900168","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I70900168","ror":"https://ror.org/04gqg1a07","display_name":"Universit\u00e9 Savoie Mont Blanc","country_code":"FR","type":"education","lineage":["https://openalex.org/I70900168"]}],"topics":[{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","count":20,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":18,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":14,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","count":13,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":0.0001783,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":9.3e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","value":6.62e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","value":5.99e-05,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","value":5.08e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.9567209482192993},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6936814785003662},{"id":"24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","score":0.596923828125},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.46912670135498047},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3342742323875427}],"counts_by_year":[{"year":1983,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1985,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1987,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1988,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":1993,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2000,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2002,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":2},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":2}],"display_name_alternatives":["Ang\u00e9nieux, G.","G Ang\u00e9nieux","G. Angenieux","G. Ange\u0301nieux","G. Ang\u00e9nieux","Gilbert Angenieux"],"block_key":"g angenieux","works_api_url":"https://api.openalex.org/works?filter=author.id:A5052188490","updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}