{"id":"https://openalex.org/A5050357286","orcid":"https://orcid.org/0000-0002-1494-6732","observed_orcids":["https://orcid.org/0000-0002-1494-6732"],"display_name":"Benjamin A. Bircher","raw_author_names":["B. A. Bircher","Benjamin A Bircher","Benjamin A. Bircher","Benjamin Andreas Bircher","Benjamin Bircher","Bircher, Benjamin A.","Bircher, Benjamin Andreas"],"full_name":"Bircher, Benjamin Andreas","works_count":29,"cited_by_count":509,"summary_stats":{"2yr_mean_citedness":7.5,"h_index":12,"i10_index":16},"ids":{"openalex":"https://openalex.org/A5050357286","orcid":"https://orcid.org/0000-0002-1494-6732","observed_orcids":["https://orcid.org/0000-0002-1494-6732"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1850255","ror":"https://ror.org/02s6k3f65","display_name":"University of Basel","country_code":"CH","type":"education","lineage":["https://openalex.org/I1850255"]},"years":[2019,2015,2014,2013]},{"institution":{"id":"https://openalex.org/I2801237587","ror":"https://ror.org/04ptp8872","display_name":"London Centre for Nanotechnology","country_code":"GB","type":"facility","lineage":["https://openalex.org/I2801237587"]},"years":[2010]},{"institution":{"id":"https://openalex.org/I4210103407","ror":"https://ror.org/0115xv923","display_name":"Swiss Federal Institute of Metrology","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]},"years":[2024,2023,2022,2021,2020,2019,2017]},{"institution":{"id":"https://openalex.org/I45129253","ror":"https://ror.org/02jx3x895","display_name":"University College London","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I45129253"]},"years":[2010]}],"last_known_institutions":[{"id":"https://openalex.org/I4210103407","ror":"https://ror.org/0115xv923","display_name":"Swiss Federal Institute of Metrology","country_code":"CH","type":"government","lineage":["https://openalex.org/I4210103407"]}],"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":14,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":11,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":7.69e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","value":5.27e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","value":4.26e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","value":3.8e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":3.68e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8995952010154724},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.8273959159851074},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6312620639801025},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5662612318992615},{"id":"159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","score":0.5119925141334534}],"counts_by_year":[{"year":2010,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2013,"works_count":3,"oa_works_count":3,"cited_by_count":4},{"year":2014,"works_count":2,"oa_works_count":2,"cited_by_count":17},{"year":2015,"works_count":1,"oa_works_count":1,"cited_by_count":13},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":18},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2019,"works_count":6,"oa_works_count":5,"cited_by_count":23},{"year":2020,"works_count":1,"oa_works_count":1,"cited_by_count":20},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":28},{"year":2022,"works_count":7,"oa_works_count":7,"cited_by_count":35},{"year":2023,"works_count":4,"oa_works_count":4,"cited_by_count":52},{"year":2024,"works_count":2,"oa_works_count":2,"cited_by_count":76},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":84},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":88}],"display_name_alternatives":["B. A. Bircher","Benjamin A Bircher","Benjamin A. Bircher","Benjamin Andreas Bircher","Benjamin Bircher","Bircher, Benjamin A.","Bircher, Benjamin Andreas"],"block_key":"b bircher","works_api_url":"https://api.openalex.org/works?filter=author.id:A5050357286","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5050357286","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}