{"id":"https://openalex.org/A5049666232","orcid":"https://orcid.org/0000-0003-0345-828X","observed_orcids":["https://orcid.org/0000-0003-0345-828X"],"display_name":"Yiming Zhang","raw_author_names":["Yiming Zhang"],"full_name":"Zhang, Yiming","works_count":3,"cited_by_count":102,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":3,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5049666232","orcid":"https://orcid.org/0000-0003-0345-828X","observed_orcids":["https://orcid.org/0000-0003-0345-828X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I9224756","ror":"https://ror.org/03awzbc87","display_name":"Northeastern University","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]},"years":[2023]}],"last_known_institutions":[{"id":"https://openalex.org/I9224756","ror":"https://ror.org/03awzbc87","display_name":"Northeastern University","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"topics":[{"id":"https://openalex.org/T11307","display_name":"Domain Adaptation and Few-Shot Learning","count":3,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":1,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11714","display_name":"Multimodal Machine Learning Applications","count":1,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11307","display_name":"Domain Adaptation and Few-Shot Learning","value":1.24e-05,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11714","display_name":"Multimodal Machine Learning Applications","value":7e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":5.1e-06,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":4.6e-06,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10689","display_name":"Remote-Sensing Image Classification","value":3.5e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8077713847160339},{"id":"89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","score":0.7368855476379395},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7332770824432373},{"id":"115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","score":0.4119282364845276},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.10387301445007324}],"counts_by_year":[{"year":2023,"works_count":3,"oa_works_count":1,"cited_by_count":10},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":21},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":39},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":32}],"display_name_alternatives":["Yiming Zhang"],"block_key":"y zhang","works_api_url":"https://api.openalex.org/works?filter=author.id:A5049666232","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2023-02-21T00:00:00"}