{"id":"https://openalex.org/A5049495877","orcid":"https://orcid.org/0000-0003-4899-1651","observed_orcids":["https://orcid.org/0000-0003-4899-1651"],"display_name":"Yuwei Zhai","raw_author_names":["Yu-wei Zhai","Yuwei Zhai","Zhai Yu-wei","Zhai Yuwei"],"full_name":"Yuwei Zhai","works_count":8,"cited_by_count":36,"summary_stats":{"2yr_mean_citedness":7.0,"h_index":3,"i10_index":2},"ids":{"openalex":"https://openalex.org/A5049495877","orcid":"https://orcid.org/0000-0003-4899-1651","observed_orcids":["https://orcid.org/0000-0003-4899-1651"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210160974","ror":"https://ror.org/050777m95","display_name":"Hebei Semiconductor Research Institute","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210160974"]},"years":[2024,2023,2022,2021,2016,2013]}],"last_known_institutions":[{"id":"https://openalex.org/I4210160974","ror":"https://ror.org/050777m95","display_name":"Hebei Semiconductor Research Institute","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210160974"]}],"topics":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","count":5,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","count":4,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","count":2,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11856","display_name":"Thermography and Photoacoustic Techniques","value":4.95e-05,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":2.84e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","value":1.72e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","value":1.37e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11277","display_name":"Thermal properties of materials","value":1.3e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.86439049243927},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6938551664352417},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6661982536315918},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2473333477973938},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.1555984914302826}],"counts_by_year":[{"year":2013,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2023,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2024,"works_count":2,"oa_works_count":0,"cited_by_count":7},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":6}],"display_name_alternatives":["Yu-wei Zhai","Yuwei Zhai","Zhai Yu-wei","Zhai Yuwei"],"block_key":"y zhai","works_api_url":"https://api.openalex.org/works?filter=author.id:A5049495877","awards_count":0,"updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}