{"id":"https://openalex.org/A5049198886","orcid":"https://orcid.org/0000-0003-0350-4928","observed_orcids":["https://orcid.org/0000-0003-0350-4928"],"display_name":"Linming Hou","raw_author_names":["Linming Hou"],"full_name":"Linming Hou","works_count":7,"cited_by_count":203,"summary_stats":{"2yr_mean_citedness":2.8,"h_index":3,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5049198886","orcid":"https://orcid.org/0000-0003-0350-4928","observed_orcids":["https://orcid.org/0000-0003-0350-4928"]},"affiliations":[{"institution":{"id":"https://openalex.org/I184843921","ror":"https://ror.org/018hded08","display_name":"Hebei University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]},"years":[2021]},{"institution":{"id":"https://openalex.org/I4210135740","ror":"https://ror.org/04a2kft13","display_name":"Haier Group (China)","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210135740"]},"years":[2025]},{"institution":{"id":"https://openalex.org/I4405272076","ror":"https://ror.org/03h0f9b72","display_name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4405272076"]},"years":[2021]}],"last_known_institutions":[{"id":"https://openalex.org/I4210135740","ror":"https://ror.org/04a2kft13","display_name":"Haier Group (China)","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210135740"]}],"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":3,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","count":3,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12077","display_name":"Vacuum and Plasma Arcs","count":2,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":6.03e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","value":4.69e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","value":1.33e-05,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","value":1.21e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","value":1.17e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7101662158966064},{"id":"200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","score":0.46524298191070557},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3704720139503479},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.35650312900543213},{"id":"127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","score":0.26490268111228943}],"counts_by_year":[{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":24},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":34},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":38},{"year":2025,"works_count":5,"oa_works_count":4,"cited_by_count":64},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":41}],"display_name_alternatives":["Linming Hou"],"block_key":"l hou","works_api_url":"https://api.openalex.org/works?filter=author.id:A5049198886","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5049198886","updated_date":"2026-11-10T14:30:39","created_date":"2021-07-05T00:00:00"}