{"id":"https://openalex.org/A5049106983","orcid":"https://orcid.org/0000-0002-6076-3689","observed_orcids":["https://orcid.org/0000-0002-6076-3689"],"display_name":"Zhitao Wen","raw_author_names":["Zhitao Wen"],"full_name":"Zhitao Wen","works_count":14,"cited_by_count":233,"summary_stats":{"2yr_mean_citedness":8.0,"h_index":7,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5049106983","orcid":"https://orcid.org/0000-0002-6076-3689","observed_orcids":["https://orcid.org/0000-0002-6076-3689"]},"affiliations":[{"institution":{"id":"https://openalex.org/I184843921","ror":"https://ror.org/018hded08","display_name":"Hebei University of Technology","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]},"years":[2022,2021,2020]},{"institution":{"id":"https://openalex.org/I79995938","ror":"https://ror.org/05mg82t36","display_name":"China People's Police University","country_code":"CN","type":"funder","lineage":["https://openalex.org/I4210133972","https://openalex.org/I4396570617","https://openalex.org/I79995938"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I9224756","ror":"https://ror.org/03awzbc87","display_name":"Northeastern University","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]},"years":[2026,2025,2024]}],"last_known_institutions":[{"id":"https://openalex.org/I9224756","ror":"https://ror.org/03awzbc87","display_name":"Northeastern University","country_code":"CN","type":"education","lineage":["https://openalex.org/I9224756"]}],"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","count":8,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","count":6,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","count":5,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","count":5,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","value":3.64e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","value":3e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","value":2.96e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","value":2.35e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","value":1.96e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8230999708175659},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7214999794960022},{"id":"43521106","wikidata":"https://www.wikidata.org/wiki/Q2165493","display_name":"Pipeline (software)","score":0.6988999843597412},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4111138880252838},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.23825064301490784}],"counts_by_year":[{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":95},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":42},{"year":2022,"works_count":2,"oa_works_count":1,"cited_by_count":16},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":25},{"year":2025,"works_count":7,"oa_works_count":0,"cited_by_count":55},{"year":2026,"works_count":2,"oa_works_count":0,"cited_by_count":0}],"display_name_alternatives":["Zhitao Wen"],"block_key":"z wen","works_api_url":"https://api.openalex.org/works?filter=author.id:A5049106983","updated_date":"2026-10-15T12:44:11","created_date":"2025-10-10T00:00:00"}