{"id":"https://openalex.org/A5046748552","orcid":"https://orcid.org/0000-0001-9415-0111","observed_orcids":["https://orcid.org/0000-0001-9415-0111"],"display_name":"Christoph Zechner","raw_author_names":["C Zechner","C. Zechner","Christoph Zechner"],"full_name":"Christoph Zechner","works_count":65,"cited_by_count":480,"summary_stats":{"2yr_mean_citedness":4.0,"h_index":12,"i10_index":18},"ids":{"openalex":"https://openalex.org/A5046748552","orcid":"https://orcid.org/0000-0001-9415-0111","observed_orcids":["https://orcid.org/0000-0001-9415-0111"]},"affiliations":[{"institution":{"id":"https://openalex.org/I1292669757","ror":"https://ror.org/0326v3z14","display_name":"Toshiba (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I1292669757"]},"years":[2022]},{"institution":{"id":"https://openalex.org/I1335490905","ror":"https://ror.org/03mb54f81","display_name":"Synopsys (Switzerland)","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},"years":[2022,2012,2011,2010,2009,2008,2007,2005]},{"institution":{"id":"https://openalex.org/I189712700","ror":"https://ror.org/0546hnb39","display_name":"University of Konstanz","country_code":"DE","type":"education","lineage":["https://openalex.org/I189712700"]},"years":[2002,2000,1999,1998,1997]},{"institution":{"id":"https://openalex.org/I193427800","ror":"https://ror.org/04h1q4c89","display_name":"Applied Materials (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I193427800"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I35440088","ror":"https://ror.org/05a28rw58","display_name":"ETH Zurich","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]},"years":[2003]},{"institution":{"id":"https://openalex.org/I35662394","ror":"https://ror.org/02h0ps145","display_name":"GlobalFoundries (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]},"years":[2017]},{"institution":{"id":"https://openalex.org/I4210088951","ror":"https://ror.org/013by2m91","display_name":"Synopsys (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]},"years":[2008]},{"institution":{"id":"https://openalex.org/I4210115292","ror":"https://ror.org/021ztkr23","display_name":"Synopsys (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210088951","https://openalex.org/I4210115292"]},"years":[2024,2023,2022,2018,2016,2015,2014,2013,2012]},{"institution":{"id":"https://openalex.org/I4405275642","ror":"https://ror.org/040wv9y89","display_name":"Toshiba Electronic Devices & Storage Corporation (Japan)","country_code":"JP","type":"company","lineage":["https://openalex.org/I4405275642"]},"years":[2022]}],"last_known_institutions":[{"id":"https://openalex.org/I4210115292","ror":"https://ror.org/021ztkr23","display_name":"Synopsys (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210088951","https://openalex.org/I4210115292"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":45,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":36,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","count":32,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","count":24,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","count":16,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","value":0.0001185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10624","display_name":"Silicon and Solar Cell Technologies","value":0.0001009,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":9.31e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","value":7.98e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":7.28e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8745261430740356},{"id":"544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","score":0.7660923600196838},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.604127049446106},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5851532220840454},{"id":"185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","score":0.43515291810035706}],"counts_by_year":[{"year":1997,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":1999,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":8,"oa_works_count":2,"cited_by_count":0},{"year":2003,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":2004,"works_count":4,"oa_works_count":1,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":1,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":16},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":27},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":34},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":18},{"year":2016,"works_count":2,"oa_works_count":0,"cited_by_count":22},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":12},{"year":2018,"works_count":2,"oa_works_count":0,"cited_by_count":7},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":12},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":7},{"year":2023,"works_count":2,"oa_works_count":0,"cited_by_count":19},{"year":2024,"works_count":3,"oa_works_count":2,"cited_by_count":12},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":17}],"display_name_alternatives":["C Zechner","C. Zechner","Christoph Zechner"],"block_key":"c zechner","works_api_url":"https://api.openalex.org/works?filter=author.id:A5046748552","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5046748552","updated_date":"2026-11-12T13:17:38","created_date":"2016-06-24T00:00:00"}