{"id":"https://openalex.org/A5045809684","orcid":"https://orcid.org/0000-0002-9771-9534","observed_orcids":["https://orcid.org/0000-0002-9771-9534"],"display_name":"I I Sytko","raw_author_names":["I I Sytko","I. I. Sytko","I.I. Sytko","Ivan I. Sytko","Ivan Sytko","Sytko Ivan"],"full_name":"Ivan I. Sytko","works_count":10,"cited_by_count":43,"summary_stats":{"2yr_mean_citedness":3.5,"h_index":4,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5045809684","orcid":"https://orcid.org/0000-0002-9771-9534","observed_orcids":["https://orcid.org/0000-0002-9771-9534"]},"affiliations":[{"institution":{"id":"https://openalex.org/I3018660459","ror":"https://ror.org/01ma17032","display_name":"Saint Petersburg Mining University","country_code":"RU","type":"education","lineage":["https://openalex.org/I3018660459"]},"years":[2026,2024,2023,2021,2019,2018]},{"institution":{"id":"https://openalex.org/I4210117200","ror":"https://ror.org/024nvcs33","display_name":"Military Space Academy named after AF Mozhaisky","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210117200"]},"years":[2020]}],"last_known_institutions":[{"id":"https://openalex.org/I3018660459","ror":"https://ror.org/01ma17032","display_name":"Saint Petersburg Mining University","country_code":"RU","type":"education","lineage":["https://openalex.org/I3018660459"]}],"topics":[{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","count":2,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10102","display_name":"scientometrics and bibliometrics research","count":1,"subfield":{"id":"https://openalex.org/subfields/3309","display_name":"Library and Information Sciences"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","value":4.07e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14163","display_name":"Astronomical Observations and Instrumentation","value":1.75e-05,"subfield":{"id":"https://openalex.org/subfields/3103","display_name":"Astronomy and Astrophysics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","value":1.35e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","value":1.32e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11484","display_name":"Adaptive optics and wavefront sensing","value":9.2e-06,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6142509579658508},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.5218069553375244},{"id":"11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","score":0.4358574450016022},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.39907363057136536},{"id":"199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","score":0.0}],"counts_by_year":[{"year":2018,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2019,"works_count":2,"oa_works_count":2,"cited_by_count":4},{"year":2020,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":6},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":3,"oa_works_count":2,"cited_by_count":3},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":15},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":3}],"display_name_alternatives":["I I Sytko","I. I. Sytko","I.I. Sytko","Ivan I. Sytko","Ivan Sytko","Sytko Ivan"],"block_key":"i sytko","works_api_url":"https://api.openalex.org/works?filter=author.id:A5045809684","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5045809684","updated_date":"2026-11-12T13:17:38","created_date":"2018-11-29T00:00:00"}