{"id":"https://openalex.org/A5044575144","orcid":"https://orcid.org/0000-0001-8530-6276","observed_orcids":["https://orcid.org/0000-0001-8530-6276"],"display_name":"Alex Davila\u2010Frias","raw_author_names":["Alex Davila Frias","Alex Davila-Frias","Alex Davila\u2010Frias","Davila Frias, Alex","D\u00e1vila Fr\u00edas, Alex Vicente"],"full_name":"Alex Davila\u2010Frias","works_count":17,"cited_by_count":130,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5044575144","orcid":"https://orcid.org/0000-0001-8530-6276","observed_orcids":["https://orcid.org/0000-0001-8530-6276"]},"affiliations":[{"institution":{"id":"https://openalex.org/I57328836","ror":"https://ror.org/05h1bnb22","display_name":"North Dakota State University","country_code":"US","type":"education","lineage":["https://openalex.org/I57328836"]},"years":[2021,2020,2019]},{"institution":{"id":"https://openalex.org/I70764802","ror":"https://ror.org/01gb99w41","display_name":"National Polytechnic School","country_code":"EC","type":"education","lineage":["https://openalex.org/I70764802"]},"years":[2025,2024,2023,2022,2020,2006]}],"last_known_institutions":[{"id":"https://openalex.org/I70764802","ror":"https://ror.org/01gb99w41","display_name":"National Polytechnic School","country_code":"EC","type":"education","lineage":["https://openalex.org/I70764802"]}],"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":14,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","count":5,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","count":5,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","count":5,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10320","display_name":"Neural Networks and Applications","count":3,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","value":6.64e-05,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":4.24e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","value":3.77e-05,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","value":3.51e-05,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","value":2.82e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.741624116897583},{"id":"200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","score":0.7133815288543701},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.6823217868804932},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.33129000663757324},{"id":"163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","score":0.2653000056743622}],"counts_by_year":[{"year":2006,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2020,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":2021,"works_count":4,"oa_works_count":1,"cited_by_count":7},{"year":2022,"works_count":2,"oa_works_count":1,"cited_by_count":12},{"year":2023,"works_count":3,"oa_works_count":0,"cited_by_count":20},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":30},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":31},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":30}],"display_name_alternatives":["Alex Davila Frias","Alex Davila-Frias","Alex Davila\u2010Frias","Davila Frias, Alex","D\u00e1vila Fr\u00edas, Alex Vicente"],"block_key":"a davila-frias","works_api_url":"https://api.openalex.org/works?filter=author.id:A5044575144","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5044575144","updated_date":"2026-11-10T14:30:39","created_date":"2019-08-13T00:00:00"}