{"id":"https://openalex.org/A5043742475","orcid":"https://orcid.org/0009-0003-3815-286X","observed_orcids":["https://orcid.org/0009-0003-3815-286X"],"display_name":"Samir Sekiou","raw_author_names":["Samir Sekiou"],"full_name":"Samir Sekiou","works_count":3,"cited_by_count":11,"summary_stats":{"2yr_mean_citedness":7.0,"h_index":2,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5043742475","orcid":"https://orcid.org/0009-0003-3815-286X","observed_orcids":["https://orcid.org/0009-0003-3815-286X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I162489102","ror":"https://ror.org/04hrbe508","display_name":"University of Batna 1","country_code":"DZ","type":"education","lineage":["https://openalex.org/I162489102"]},"years":[2013]},{"institution":{"id":"https://openalex.org/I4387153399","ror":"https://ror.org/02yvp6477","display_name":"University of Batna 2","country_code":"DZ","type":"education","lineage":["https://openalex.org/I4387153399"]},"years":[2025]}],"last_known_institutions":[{"id":"https://openalex.org/I4387153399","ror":"https://ror.org/02yvp6477","display_name":"University of Batna 2","country_code":"DZ","type":"education","lineage":["https://openalex.org/I4387153399"]}],"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":3,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":1,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":1,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","count":1,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","count":1,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T14042","display_name":"Technology and Security Systems","value":3.95e-05,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","value":1.04e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":1.03e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","value":4.2e-06,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":4e-06,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","score":0.5943208932876587},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.5014655590057373},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.43087077140808105},{"id":"111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","score":0.0},{"id":"127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","score":0.0}],"counts_by_year":[{"year":2013,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":7}],"display_name_alternatives":["Samir Sekiou"],"block_key":"s sekiou","works_api_url":"https://api.openalex.org/works?filter=author.id:A5043742475","awards_count":0,"updated_date":"2026-11-06T12:48:51","created_date":"2016-06-24T00:00:00"}