{"id":"https://openalex.org/A5042989337","orcid":"https://orcid.org/0000-0002-3451-2595","observed_orcids":["https://orcid.org/0000-0002-3451-2595"],"display_name":"Tomasz D\u0142ugosz","raw_author_names":["T. Dlugosz","T. D\u0142ugosz","TOMASZ D\u0141UGOSZ","Tomasz DLUGOSZ","Tomasz Dlugosz","Tomasz D\u0141UGOSZ","Tomasz D\u0142ugosz"],"full_name":"D\u0142ugosz, Tomasz","works_count":53,"cited_by_count":100,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5042989337","orcid":"https://orcid.org/0000-0002-3451-2595","observed_orcids":["https://orcid.org/0000-0002-3451-2595"]},"affiliations":[{"institution":{"id":"https://openalex.org/I11923345","ror":"https://ror.org/008fyn775","display_name":"Wroc\u0142aw University of Science and Technology","country_code":"PL","type":"education","lineage":["https://openalex.org/I11923345"]},"years":[2017,2015,2014,2013,2012,2011,2010,2009,2008,2007]},{"institution":{"id":"https://openalex.org/I154893126","ror":"https://ror.org/02x1pa065","display_name":"Guizhou Normal University","country_code":"CN","type":"education","lineage":["https://openalex.org/I154893126"]},"years":[2010]},{"institution":{"id":"https://openalex.org/I219388962","ror":"https://ror.org/00yae6e25","display_name":"University of Wroc\u0142aw","country_code":"PL","type":"education","lineage":["https://openalex.org/I219388962"]},"years":[2011,2010,2008]},{"institution":{"id":"https://openalex.org/I4210158376","ror":"https://ror.org/05a550a57","display_name":"DSW Ideis University","country_code":"PL","type":"education","lineage":["https://openalex.org/I4210158376","https://openalex.org/I4405265935"]},"years":[2026]}],"last_known_institutions":[{"id":"https://openalex.org/I4210158376","ror":"https://ror.org/05a550a57","display_name":"DSW Ideis University","country_code":"PL","type":"education","lineage":["https://openalex.org/I4210158376","https://openalex.org/I4405265935"]}],"topics":[{"id":"https://openalex.org/T10874","display_name":"Electromagnetic Fields and Biological Effects","count":24,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","count":23,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":14,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","count":7,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11263","display_name":"Electromagnetic Simulation and Numerical Methods","count":6,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T10874","display_name":"Electromagnetic Fields and Biological Effects","value":0.0002287,"subfield":{"id":"https://openalex.org/subfields/1304","display_name":"Biophysics"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","value":0.0001829,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","value":0.0001504,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":9.29e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","value":6.18e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.734444260597229},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5709472298622131},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.4602999985218048},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.42369088530540466},{"id":"62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","score":0.12855461239814758}],"counts_by_year":[{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":2010,"works_count":11,"oa_works_count":1,"cited_by_count":0},{"year":2011,"works_count":7,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":6,"oa_works_count":0,"cited_by_count":7},{"year":2013,"works_count":3,"oa_works_count":1,"cited_by_count":9},{"year":2014,"works_count":5,"oa_works_count":1,"cited_by_count":14},{"year":2015,"works_count":3,"oa_works_count":1,"cited_by_count":9},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2022,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":1}],"display_name_alternatives":["T. Dlugosz","T. D\u0142ugosz","TOMASZ D\u0141UGOSZ","Tomasz DLUGOSZ","Tomasz Dlugosz","Tomasz D\u0141UGOSZ","Tomasz D\u0142ugosz"],"block_key":"t dlugosz","works_api_url":"https://api.openalex.org/works?filter=author.id:A5042989337","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5042989337","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}