{"id":"https://openalex.org/A5042844692","orcid":"https://orcid.org/0009-0002-6576-2690","observed_orcids":["https://orcid.org/0009-0002-6576-2690"],"display_name":"J. W. Park","raw_author_names":["J. W. Park","Jung Woo Park","Jung Woo, Park","Jung-Woo Park"],"full_name":"Jung Woo Park","works_count":5,"cited_by_count":17,"summary_stats":{"2yr_mean_citedness":1.0,"h_index":3,"i10_index":0},"ids":{"openalex":"https://openalex.org/A5042844692","orcid":"https://orcid.org/0009-0002-6576-2690","observed_orcids":["https://orcid.org/0009-0002-6576-2690"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210162967","ror":"https://ror.org/05d5mtz58","display_name":"Hansol Chemical (South Korea)","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210162967"]},"years":[2026,2025]},{"institution":{"id":"https://openalex.org/I4921948","ror":"https://ror.org/01an57a31","display_name":"Pusan National University","country_code":"KR","type":"education","lineage":["https://openalex.org/I4921948"]},"years":[2004]}],"last_known_institutions":[{"id":"https://openalex.org/I4210162967","ror":"https://ror.org/05d5mtz58","display_name":"Hansol Chemical (South Korea)","country_code":"KR","type":"company","lineage":["https://openalex.org/I4210162967"]}],"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":3,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","count":2,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","count":1,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","count":1,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12200","display_name":"Heusler alloys: electronic and magnetic properties","value":3.8e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":2.97e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","value":1.51e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11169","display_name":"Silicon Nanostructures and Photoluminescence","value":9.5e-06,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","value":9.3e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8921077251434326},{"id":"19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","score":0.74976646900177},{"id":"57410435","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Chemical vapor deposition","score":0.662420392036438},{"id":"2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","score":0.6025474667549133},{"id":"42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","score":0.39489999413490295}],"counts_by_year":[{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2026,"works_count":2,"oa_works_count":1,"cited_by_count":4}],"display_name_alternatives":["J. W. Park","Jung Woo Park","Jung Woo, Park","Jung-Woo Park"],"block_key":"j park","works_api_url":"https://api.openalex.org/works?filter=author.id:A5042844692","awards_count":0,"updated_date":"2026-10-27T12:30:23","created_date":"2016-06-24T00:00:00"}
