{"id":"https://openalex.org/A5042278366","orcid":null,"observed_orcids":[],"display_name":"Rod Augur","raw_author_names":["Augur Rod","R. Augur","Rod Augur"],"full_name":"Rod Augur","works_count":46,"cited_by_count":454,"summary_stats":{"2yr_mean_citedness":1.0,"h_index":13,"i10_index":16},"ids":{"openalex":"https://openalex.org/A5042278366","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I35662394","ror":"https://ror.org/02h0ps145","display_name":"GlobalFoundries (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]},"years":[2024,2023,2022,2021,2020,2019,2018,2017,2015,2014,2011]}],"last_known_institutions":[{"id":"https://openalex.org/I35662394","ror":"https://ror.org/02h0ps145","display_name":"GlobalFoundries (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I35662394"]}],"topics":[{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","count":29,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","count":17,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":13,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","count":8,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":0.0002002,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":0.0001282,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","value":9.48e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10666","display_name":"Photonic Crystals and Applications","value":5.41e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","value":3.6e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9313844442367554},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7837176322937012},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7212537527084351},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.3997388780117035},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.38874107599258423}],"counts_by_year":[{"year":2002,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2003,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":5},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":12},{"year":2015,"works_count":1,"oa_works_count":0,"cited_by_count":6},{"year":2016,"works_count":1,"oa_works_count":1,"cited_by_count":12},{"year":2017,"works_count":1,"oa_works_count":0,"cited_by_count":7},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":20},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":17},{"year":2020,"works_count":8,"oa_works_count":1,"cited_by_count":15},{"year":2021,"works_count":8,"oa_works_count":1,"cited_by_count":22},{"year":2022,"works_count":5,"oa_works_count":1,"cited_by_count":11},{"year":2023,"works_count":8,"oa_works_count":3,"cited_by_count":69},{"year":2024,"works_count":1,"oa_works_count":0,"cited_by_count":79},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":52},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":53}],"display_name_alternatives":["Augur Rod","R. Augur","Rod Augur"],"block_key":"r augur","works_api_url":"https://api.openalex.org/works?filter=author.id:A5042278366","awards_count":0,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5042278366","updated_date":"2026-11-11T13:02:13","created_date":"2016-06-24T00:00:00"}