{"id":"https://openalex.org/A5041108987","orcid":null,"observed_orcids":[],"display_name":"Jocelyn Berthoz","raw_author_names":["J. Berthoz","Jocelyn Berthoz"],"full_name":"Jocelyn Berthoz","works_count":28,"cited_by_count":191,"summary_stats":{"2yr_mean_citedness":0.25,"h_index":9,"i10_index":6},"ids":{"openalex":"https://openalex.org/A5041108987","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I158043002","ror":"https://ror.org/00j681549","display_name":"Sofradir (France)","country_code":"FR","type":"company","lineage":["https://openalex.org/I158043002"]},"years":[2019,2017,2016,2015,2014]},{"institution":{"id":"https://openalex.org/I2738703131","ror":"https://ror.org/00jjx8s55","display_name":"Commissariat \u00e0 l'\u00c9nergie Atomique et aux \u00c9nergies Alternatives","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131"]},"years":[2014,2012]},{"institution":{"id":"https://openalex.org/I3020098449","ror":"https://ror.org/02mg6n827","display_name":"CEA Grenoble","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I3020098449"]},"years":[2014,2012]},{"institution":{"id":"https://openalex.org/I4210150049","ror":"https://ror.org/04mf0wv34","display_name":"Laboratoire d'\u00c9lectronique des Technologies de l'Information","country_code":"FR","type":"government","lineage":["https://openalex.org/I2738703131","https://openalex.org/I4210117989","https://openalex.org/I4210150049"]},"years":[2014,2012]},{"institution":{"id":"https://openalex.org/I4392738279","ror":"https://ror.org/05v727m31","display_name":"Communaut\u00e9 Universit\u00e9 Grenoble Alpes","country_code":"FR","type":"education","lineage":["https://openalex.org/I4392738279","https://openalex.org/I899635006"]},"years":[2016]},{"institution":{"id":"https://openalex.org/I899635006","ror":"https://ror.org/02rx3b187","display_name":"Universit\u00e9 Grenoble Alpes","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]},"years":[2016]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","count":26,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","count":22,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","count":21,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":3,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","value":0.0004289,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","value":0.0002422,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","value":0.0001159,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","value":2.81e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11803","display_name":"Superconducting and THz Device Technology","value":8.6e-06,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7143101096153259},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.7141711711883545},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.6678711175918579},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6108078956604004},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5850710272789001}],"counts_by_year":[{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":4},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":5,"oa_works_count":0,"cited_by_count":5},{"year":2015,"works_count":3,"oa_works_count":1,"cited_by_count":12},{"year":2016,"works_count":6,"oa_works_count":0,"cited_by_count":19},{"year":2017,"works_count":3,"oa_works_count":0,"cited_by_count":20},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":22},{"year":2019,"works_count":1,"oa_works_count":0,"cited_by_count":21},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":8},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":7},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2023,"works_count":2,"oa_works_count":1,"cited_by_count":20},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2025,"works_count":2,"oa_works_count":0,"cited_by_count":12},{"year":2026,"works_count":2,"oa_works_count":0,"cited_by_count":9}],"display_name_alternatives":["J. Berthoz","Jocelyn Berthoz"],"block_key":"j berthoz","works_api_url":"https://api.openalex.org/works?filter=author.id:A5041108987","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}