{"id":"https://openalex.org/A5040894739","orcid":"https://orcid.org/0000-0003-2718-8229","observed_orcids":["https://orcid.org/0000-0003-2718-8229"],"display_name":"Hasan Iqbal","raw_author_names":["Hasan Iqbal","Iqbal, Hasan"],"full_name":"Iqbal, Hasan","works_count":10,"cited_by_count":111,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":3},"ids":{"openalex":"https://openalex.org/A5040894739","orcid":"https://orcid.org/0000-0003-2718-8229","observed_orcids":["https://orcid.org/0000-0003-2718-8229"]},"affiliations":[{"institution":{"id":"https://openalex.org/I147869694","ror":"https://ror.org/0359s0245","display_name":"Continental (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I147869694"]},"years":[2025,2023,2021]},{"institution":{"id":"https://openalex.org/I196349391","ror":"https://ror.org/032000t02","display_name":"Universit\u00e4t Ulm","country_code":"DE","type":"education","lineage":["https://openalex.org/I196349391"]},"years":[2018,2017,2015]}],"last_known_institutions":[{"id":"https://openalex.org/I147869694","ror":"https://ror.org/0359s0245","display_name":"Continental (Germany)","country_code":"DE","type":"company","lineage":["https://openalex.org/I147869694"]}],"topics":[{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","count":9,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10891","display_name":"Radar Systems and Signal Processing","count":3,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","value":5.82e-05,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","value":4.36e-05,"subfield":{"id":"https://openalex.org/subfields/1908","display_name":"Geophysics"},"field":{"id":"https://openalex.org/fields/19","display_name":"Earth and Planetary Sciences"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","value":1.67e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":1.33e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","value":1.31e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","score":0.8649976849555969},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7256036400794983},{"id":"554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","score":0.6945523619651794},{"id":"146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","score":0.4128914475440979},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.2690922021865845}],"counts_by_year":[{"year":2015,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2018,"works_count":2,"oa_works_count":1,"cited_by_count":7},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2021,"works_count":2,"oa_works_count":1,"cited_by_count":19},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":18},{"year":2023,"works_count":3,"oa_works_count":1,"cited_by_count":23},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":14},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":11},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":4}],"display_name_alternatives":["Hasan Iqbal","Iqbal, Hasan"],"block_key":"h iqbal","works_api_url":"https://api.openalex.org/works?filter=author.id:A5040894739","awards_count":0,"updated_date":"2026-11-05T13:29:08","created_date":"2016-10-28T00:00:00"}