{"id":"https://openalex.org/A5040851820","orcid":"https://orcid.org/0000-0002-2021-3674","observed_orcids":["https://orcid.org/0000-0002-2021-3674"],"display_name":"A.Y.C. Yu","raw_author_names":["A. Y -C. Yu","A. Y- C. Yu","A. Y-C. Yu","A. Y. -C. Yu","A. Y. C. YU","A. Y. C. Yu","A.Y.C. Yu","Albert Y. Yu","Albert Yeou-Cherng Yu"],"full_name":"A. Y. -C. Yu","works_count":26,"cited_by_count":1430,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":15,"i10_index":15},"ids":{"openalex":"https://openalex.org/A5040851820","orcid":"https://orcid.org/0000-0002-2021-3674","observed_orcids":["https://orcid.org/0000-0002-2021-3674"]},"affiliations":[{"institution":{"id":"https://openalex.org/I122411786","ror":"https://ror.org/05dxps055","display_name":"California Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I122411786"]},"years":[1970]},{"institution":{"id":"https://openalex.org/I1343180700","ror":"https://ror.org/01ek73717","display_name":"Intel (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},"years":[1989,1986]},{"institution":{"id":"https://openalex.org/I81844223","ror":"https://ror.org/03yca1933","display_name":"Fairchild Semiconductor (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I81844223"]},"years":[1991,1970,1969,1968]},{"institution":{"id":"https://openalex.org/I97018004","ror":"https://ror.org/00f54p054","display_name":"Stanford University","country_code":"US","type":"education","lineage":["https://openalex.org/I97018004"]},"years":[1968,1967,1966]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","count":13,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":10,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":7,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","count":7,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13645","display_name":"Thermodynamic and Structural Properties of Metals and Alloys","count":4,"subfield":{"id":"https://openalex.org/subfields/2506","display_name":"Metals and Alloys"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","value":4.82e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12200","display_name":"Heusler alloys: electronic and magnetic properties","value":3.78e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","value":2.72e-05,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","value":2.63e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":2.09e-05,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.7490835785865784},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7237280607223511},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.7018457651138306},{"id":"191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","score":0.4562999904155731},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.33260396122932434}],"counts_by_year":[{"year":1966,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1967,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1968,"works_count":7,"oa_works_count":2,"cited_by_count":0},{"year":1969,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1970,"works_count":4,"oa_works_count":0,"cited_by_count":0},{"year":1971,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1986,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":30},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":33},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":32},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":30},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":38},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":15},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":32},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":26},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":31},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":22},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":20}],"display_name_alternatives":["A. Y -C. Yu","A. Y- C. Yu","A. Y-C. Yu","A. Y. -C. Yu","A. Y. C. YU","A. Y. C. Yu","A.Y.C. Yu","Albert Y. Yu","Albert Yeou-Cherng Yu"],"block_key":"a yu","works_api_url":"https://api.openalex.org/works?filter=author.id:A5040851820","awards_count":0,"updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}