{"id":"https://openalex.org/A5038855364","orcid":"https://orcid.org/0000-0002-2712-8288","observed_orcids":["https://orcid.org/0000-0002-2712-8288"],"display_name":"Seon-Ho Jeong","raw_author_names":["Seon Ho Jeong","Seon-Ho Jeong","Seonho Jeong"],"full_name":"Seon-Ho Jeong","works_count":6,"cited_by_count":20,"summary_stats":{"2yr_mean_citedness":4.333333333333333,"h_index":2,"i10_index":1},"ids":{"openalex":"https://openalex.org/A5038855364","orcid":"https://orcid.org/0000-0002-2712-8288","observed_orcids":["https://orcid.org/0000-0002-2712-8288"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4405271536","ror":"https://ror.org/02k3mp398","display_name":"Korea Aerospace Industries (South Korea)","country_code":"KR","type":"company","lineage":["https://openalex.org/I4405271536"]},"years":[2025,2024]}],"last_known_institutions":[{"id":"https://openalex.org/I4405271536","ror":"https://ror.org/02k3mp398","display_name":"Korea Aerospace Industries (South Korea)","country_code":"KR","type":"company","lineage":["https://openalex.org/I4405271536"]}],"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","count":3,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","count":3,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","count":2,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","count":2,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10028","display_name":"Topic Modeling","count":1,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","value":2.08e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11439","display_name":"Video Analysis and Summarization","value":1.86e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","value":1.22e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","value":1.03e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10824","display_name":"Image Retrieval and Classification Techniques","value":7.6e-06,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.8078888654708862},{"id":"175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","score":0.5296000838279724},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.4989039897918701},{"id":"153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","score":0.4147277772426605},{"id":"124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","score":0.3681827187538147}],"counts_by_year":[{"year":1999,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2021,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2025,"works_count":2,"oa_works_count":2,"cited_by_count":5},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":4}],"display_name_alternatives":["Seon Ho Jeong","Seon-Ho Jeong","Seonho Jeong"],"block_key":"s jeong","works_api_url":"https://api.openalex.org/works?filter=author.id:A5038855364","awards_count":0,"updated_date":"2026-11-04T11:47:51","created_date":"2016-06-24T00:00:00"}