{"id":"https://openalex.org/A5037878384","orcid":"https://orcid.org/0000-0001-7322-8418","observed_orcids":["https://orcid.org/0000-0001-7322-8418"],"display_name":"Siraj Fulum Mossa","raw_author_names":["Siraj F Mossa","Siraj Fulum Mossa","Siraj Moosa","Siraj Mossa"],"full_name":"Siraj Fulum Mossa","works_count":10,"cited_by_count":86,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":4,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5037878384","orcid":"https://orcid.org/0000-0001-7322-8418","observed_orcids":["https://orcid.org/0000-0001-7322-8418"]},"affiliations":[{"institution":{"id":"https://openalex.org/I10654025","ror":"https://ror.org/00qajw440","display_name":"SK Group (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]},"years":[2026]},{"institution":{"id":"https://openalex.org/I1343180700","ror":"https://ror.org/01ek73717","display_name":"Intel (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]},"years":[2023]},{"institution":{"id":"https://openalex.org/I63920570","ror":"https://ror.org/05drmrq39","display_name":"Tennessee Technological University","country_code":"US","type":"education","lineage":["https://openalex.org/I63920570"]},"years":[2017,2016,2015,2014]}],"last_known_institutions":[{"id":"https://openalex.org/I10654025","ror":"https://ror.org/00qajw440","display_name":"SK Group (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I10654025","https://openalex.org/I134353371"]}],"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","count":4,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","count":4,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","count":4,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","value":6.43e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","value":4.73e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","value":4.17e-05,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","value":2.6e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","value":1.36e-05,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7899145483970642},{"id":"149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","score":0.5731217861175537},{"id":"165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","score":0.5707540512084961},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.5103873610496521},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3774794936180115}],"counts_by_year":[{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":1},{"year":2014,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2015,"works_count":3,"oa_works_count":0,"cited_by_count":2},{"year":2016,"works_count":1,"oa_works_count":0,"cited_by_count":2},{"year":2017,"works_count":2,"oa_works_count":0,"cited_by_count":11},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":8},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2023,"works_count":2,"oa_works_count":0,"cited_by_count":8},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":7},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2026,"works_count":1,"oa_works_count":0,"cited_by_count":6}],"display_name_alternatives":["Siraj F Mossa","Siraj Fulum Mossa","Siraj Moosa","Siraj Mossa"],"block_key":"s mossa","works_api_url":"https://api.openalex.org/works?filter=author.id:A5037878384","awards_count":0,"updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}