{"id":"https://openalex.org/A5037864460","orcid":"https://orcid.org/0000-0001-9680-473X","observed_orcids":["https://orcid.org/0000-0001-9680-473X"],"display_name":"Eneko Gomez-Acedo","raw_author_names":["E. Gomez-Acedo","ENEKO GOMEZ-ACEDO","Eneko Gomez-Acedo","Gomez-Acedo, Eneko"],"full_name":"Eneko Gomez-Acedo","works_count":21,"cited_by_count":452,"summary_stats":{"2yr_mean_citedness":10.0,"h_index":10,"i10_index":11},"ids":{"openalex":"https://openalex.org/A5037864460","orcid":"https://orcid.org/0000-0001-9680-473X","observed_orcids":["https://orcid.org/0000-0001-9680-473X"]},"affiliations":[{"institution":{"id":"https://openalex.org/I4210136402","ror":"https://ror.org/033vryh36","display_name":"Tekniker","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210136402"]},"years":[2024,2021,2019,2018,2017,2015,2014,2013,2012]}],"last_known_institutions":[{"id":"https://openalex.org/I4210136402","ror":"https://ror.org/033vryh36","display_name":"Tekniker","country_code":"ES","type":"nonprofit","lineage":["https://openalex.org/I4210136402"]}],"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":14,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13113","display_name":"Engineering Technology and Methodologies","count":8,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":6,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","count":5,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10905","display_name":"Solar Thermal and Photovoltaic Systems","count":4,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":7.7e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13113","display_name":"Engineering Technology and Methodologies","value":3.31e-05,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12309","display_name":"solar cell performance optimization","value":2.65e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","value":2.26e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":2.01e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6367079019546509},{"id":"78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","score":0.5702357292175293},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.5521562695503235},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.3669518828392029},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.2912999987602234}],"counts_by_year":[{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2013,"works_count":3,"oa_works_count":1,"cited_by_count":4},{"year":2014,"works_count":1,"oa_works_count":1,"cited_by_count":11},{"year":2015,"works_count":2,"oa_works_count":0,"cited_by_count":11},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2017,"works_count":1,"oa_works_count":1,"cited_by_count":9},{"year":2018,"works_count":4,"oa_works_count":2,"cited_by_count":26},{"year":2019,"works_count":5,"oa_works_count":2,"cited_by_count":50},{"year":2020,"works_count":1,"oa_works_count":0,"cited_by_count":53},{"year":2021,"works_count":1,"oa_works_count":1,"cited_by_count":40},{"year":2022,"works_count":1,"oa_works_count":0,"cited_by_count":45},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":48},{"year":2024,"works_count":1,"oa_works_count":1,"cited_by_count":51},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":40},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":51}],"display_name_alternatives":["E. Gomez-Acedo","ENEKO GOMEZ-ACEDO","Eneko Gomez-Acedo","Gomez-Acedo, Eneko"],"block_key":"e gomez-acedo","works_api_url":"https://api.openalex.org/works?filter=author.id:A5037864460","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}