{"id":"https://openalex.org/A5037619403","orcid":null,"observed_orcids":[],"display_name":"Ibrahim Serroukh","raw_author_names":["I Serroukh","I. Serroukh","Ibrahim Serroukh","Serroukh, Ibrahim"],"full_name":"Ibrahim Serroukh","works_count":18,"cited_by_count":75,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":5,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5037619403","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I121748325","ror":"https://ror.org/02p0gd045","display_name":"Universidad Complutense de Madrid","country_code":"ES","type":"education","lineage":["https://openalex.org/I121748325"]},"years":[2001,2000,1999]},{"institution":{"id":"https://openalex.org/I157492648","ror":"https://ror.org/00v8fdc16","display_name":"Autonomous University of Queretaro","country_code":"MX","type":"education","lineage":["https://openalex.org/I157492648"]},"years":[2025,2019,2013,2011,2010,2008]},{"institution":{"id":"https://openalex.org/I4387153439","ror":"https://ror.org/05v1qt749","display_name":"National Metrology Center","country_code":"MX","type":"government","lineage":["https://openalex.org/I4387153439"]},"years":[2006]},{"institution":{"id":"https://openalex.org/I98461037","ror":"https://ror.org/03ayjn504","display_name":"Tecnol\u00f3gico de Monterrey","country_code":"MX","type":"education","lineage":["https://openalex.org/I98461037"]},"years":[2005,2004]}],"last_known_institutions":[{"id":"https://openalex.org/I157492648","ror":"https://ror.org/00v8fdc16","display_name":"Autonomous University of Queretaro","country_code":"MX","type":"education","lineage":["https://openalex.org/I157492648"]}],"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","count":10,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","count":9,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","count":3,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":3,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11595","display_name":"Textile materials and evaluations","count":2,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","value":4.95e-05,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","value":3.35e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","value":2.6e-05,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","value":2.04e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14474","display_name":"Industrial Technology and Control Systems","value":1.46e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.917399525642395},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.742304265499115},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7110038995742798},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5168733596801758},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.3015580475330353}],"counts_by_year":[{"year":1999,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2000,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2003,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":2,"oa_works_count":2,"cited_by_count":0},{"year":2011,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2012,"works_count":1,"oa_works_count":1,"cited_by_count":4},{"year":2013,"works_count":1,"oa_works_count":0,"cited_by_count":4},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":6},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":2},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":4},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2025,"works_count":1,"oa_works_count":1,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["I Serroukh","I. Serroukh","Ibrahim Serroukh","Serroukh, Ibrahim"],"block_key":"i serroukh","works_api_url":"https://api.openalex.org/works?filter=author.id:A5037619403","updated_date":"2026-11-08T12:57:04","created_date":"2016-06-24T00:00:00"}