{"id":"https://openalex.org/A5037470620","orcid":null,"observed_orcids":[],"display_name":"Reza Moazzami","raw_author_names":["R Moazzami","R. Moazzami","Reza Moazzami"],"full_name":"Reza Moazzami","works_count":32,"cited_by_count":1300,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":16,"i10_index":20},"ids":{"openalex":"https://openalex.org/A5037470620","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I1333370159","ror":"https://ror.org/01hafxd32","display_name":"Motorola (United States)","country_code":"US","type":"company","lineage":["https://openalex.org/I1333370159"]},"years":[2005,2002,1995,1994,1993,1992]},{"institution":{"id":"https://openalex.org/I2803209242","ror":"https://ror.org/00pjdza24","display_name":"University of California System","country_code":"US","type":"education","lineage":["https://openalex.org/I2803209242"]},"years":[1991]},{"institution":{"id":"https://openalex.org/I63966007","ror":"https://ror.org/042nb2s44","display_name":"Massachusetts Institute of Technology","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]},"years":[1995]},{"institution":{"id":"https://openalex.org/I86519309","ror":"https://ror.org/00hj54h04","display_name":"The University of Texas at Austin","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]},"years":[2002,1994]},{"institution":{"id":"https://openalex.org/I95457486","ror":"https://ror.org/01an7q238","display_name":"University of California, Berkeley","country_code":"US","type":"education","lineage":["https://openalex.org/I95457486"]},"years":[2005,2003,2002,1993,1992,1991,1990,1989,1987]}],"last_known_institutions":null,"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","count":26,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","count":20,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","count":19,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","count":6,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","count":4,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","value":0.0002179,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10107","display_name":"Ferroelectric and Piezoelectric Materials","value":6e-05,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","value":5.39e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","value":4.25e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","value":3.95e-05,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.9594520330429077},{"id":"133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","score":0.7599058151245117},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5941550731658936},{"id":"119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","score":0.5680791139602661},{"id":"127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","score":0.33278733491897583}],"counts_by_year":[{"year":1987,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1990,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":1991,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1992,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1993,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1994,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1995,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":7,"oa_works_count":0,"cited_by_count":0},{"year":2003,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":22},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":20},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":32},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":32},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":29},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":26},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":24},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":23},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":22},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":12},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":10},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":17},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":13}],"display_name_alternatives":["R Moazzami","R. Moazzami","Reza Moazzami"],"block_key":"r moazzami","works_api_url":"https://api.openalex.org/works?filter=author.id:A5037470620","updated_date":"2026-11-07T12:08:38","created_date":"2016-06-24T00:00:00"}