{"id":"https://openalex.org/A5036733924","orcid":null,"observed_orcids":[],"display_name":"Ernest E. Armstrong","raw_author_names":["E. Armstrong","E.E. Armstrong","Ernest Armstrong","Ernest E. Armstrong"],"full_name":"Ernest E. Armstrong","works_count":22,"cited_by_count":1543,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":8,"i10_index":8},"ids":{"openalex":"https://openalex.org/A5036733924","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I102461120","ror":"https://ror.org/04gr4te78","display_name":"Marquette University","country_code":"US","type":"education","lineage":["https://openalex.org/I102461120"]},"years":[1999]},{"institution":{"id":"https://openalex.org/I127591826","ror":"https://ror.org/021v3qy27","display_name":"University of Dayton","country_code":"US","type":"education","lineage":["https://openalex.org/I127591826"]},"years":[1999]},{"institution":{"id":"https://openalex.org/I1280414376","ror":"https://ror.org/02e2egq70","display_name":"United States Air Force Research Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]},"years":[2010,2006,2001,1999,1998]},{"institution":{"id":"https://openalex.org/I2799950915","ror":"https://ror.org/0097e1k27","display_name":"Wright-Patterson Air Force Base","country_code":"US","type":"other","lineage":["https://openalex.org/I1330347796","https://openalex.org/I2799950915","https://openalex.org/I4210089612","https://openalex.org/I4210102105"]},"years":[2006,2002,1999,1997]},{"institution":{"id":"https://openalex.org/I4388482655","ror":"https://ror.org/054yf8v46","display_name":"U.S. Air Force Research Laboratory Sensors Directorate","country_code":"US","type":"funder","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482655","https://openalex.org/I4389425425"]},"years":[2006]},{"institution":{"id":"https://openalex.org/I4388482690","ror":"https://ror.org/03jvtcb24","display_name":"Wright Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4388482690","https://openalex.org/I4389425425"]},"years":[1999,1997]}],"last_known_institutions":[{"id":"https://openalex.org/I1280414376","ror":"https://ror.org/02e2egq70","display_name":"United States Air Force Research Laboratory","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280414376","https://openalex.org/I1330347796","https://openalex.org/I4210102105","https://openalex.org/I4389425425"]}],"topics":[{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","count":9,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","count":8,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","count":7,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","count":6,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13579","display_name":"Image and Video Stabilization","count":5,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T13579","display_name":"Image and Video Stabilization","value":0.0002898,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","value":0.0001378,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","value":0.0001173,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","value":6.68e-05,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","value":3.08e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","score":0.8357857465744019},{"id":"154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","score":0.7873791456222534},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.7636099457740784},{"id":"33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","score":0.5054101943969727},{"id":"115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","score":0.44435709714889526}],"counts_by_year":[{"year":1988,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1989,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1996,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":1997,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":1998,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":1999,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2000,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2004,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2009,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":3,"oa_works_count":0,"cited_by_count":0},{"year":2012,"works_count":0,"oa_works_count":0,"cited_by_count":76},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":77},{"year":2014,"works_count":0,"oa_works_count":0,"cited_by_count":82},{"year":2015,"works_count":0,"oa_works_count":0,"cited_by_count":82},{"year":2016,"works_count":0,"oa_works_count":0,"cited_by_count":73},{"year":2017,"works_count":0,"oa_works_count":0,"cited_by_count":59},{"year":2018,"works_count":0,"oa_works_count":0,"cited_by_count":47},{"year":2019,"works_count":0,"oa_works_count":0,"cited_by_count":33},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":35},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":40},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":36},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":28},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":21},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":16},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":11}],"display_name_alternatives":["E. Armstrong","E.E. Armstrong","Ernest Armstrong","Ernest E. Armstrong"],"block_key":"e armstrong","works_api_url":"https://api.openalex.org/works?filter=author.id:A5036733924","updated_date":"2026-11-05T13:29:08","created_date":"2016-06-24T00:00:00"}