{"id":"https://openalex.org/A5036036062","orcid":null,"observed_orcids":[],"display_name":"Kouji Shibata","raw_author_names":["K. SHIBATA","Kouji SHIBATA","Kouji Shibata","SHIBATA, Kouji"],"full_name":"SHIBATA, Kouji","works_count":79,"cited_by_count":242,"summary_stats":{"2yr_mean_citedness":0.2,"h_index":8,"i10_index":7},"ids":{"openalex":"https://openalex.org/A5036036062","orcid":null,"observed_orcids":[]},"affiliations":[{"institution":{"id":"https://openalex.org/I131231118","ror":"https://ror.org/002rw7y37","display_name":"Aoyama Gakuin University","country_code":"JP","type":"education","lineage":["https://openalex.org/I131231118"]},"years":[2002]},{"institution":{"id":"https://openalex.org/I168636783","ror":"https://ror.org/05wj18248","display_name":"Hachinohe Institute of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I168636783"]},"years":[2026,2025,2024,2023,2022,2021,2020,2019,2018,2017,2016,2015,2010,2008,2005]}],"last_known_institutions":[{"id":"https://openalex.org/I168636783","ror":"https://ror.org/05wj18248","display_name":"Hachinohe Institute of Technology","country_code":"JP","type":"education","lineage":["https://openalex.org/I168636783"]}],"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":71,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","count":66,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","count":55,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","count":6,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","count":5,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":0.0004709,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","value":0.0003595,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","value":0.0001674,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","value":6.94e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12155","display_name":"Microwave Dielectric Ceramics Synthesis","value":6.33e-05,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","score":0.8501898050308228},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.7965312004089355},{"id":"120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","score":0.6405857801437378},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.5059565901756287},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.47527021169662476}],"counts_by_year":[{"year":2001,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2002,"works_count":1,"oa_works_count":1,"cited_by_count":0},{"year":2004,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2005,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2006,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2007,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2008,"works_count":2,"oa_works_count":1,"cited_by_count":0},{"year":2009,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2013,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2014,"works_count":3,"oa_works_count":0,"cited_by_count":8},{"year":2015,"works_count":6,"oa_works_count":1,"cited_by_count":8},{"year":2016,"works_count":8,"oa_works_count":0,"cited_by_count":14},{"year":2017,"works_count":8,"oa_works_count":0,"cited_by_count":13},{"year":2018,"works_count":8,"oa_works_count":0,"cited_by_count":26},{"year":2019,"works_count":7,"oa_works_count":0,"cited_by_count":10},{"year":2020,"works_count":9,"oa_works_count":1,"cited_by_count":34},{"year":2021,"works_count":6,"oa_works_count":1,"cited_by_count":49},{"year":2022,"works_count":3,"oa_works_count":0,"cited_by_count":28},{"year":2023,"works_count":2,"oa_works_count":1,"cited_by_count":20},{"year":2024,"works_count":3,"oa_works_count":2,"cited_by_count":12},{"year":2025,"works_count":1,"oa_works_count":0,"cited_by_count":8},{"year":2026,"works_count":1,"oa_works_count":1,"cited_by_count":2}],"display_name_alternatives":["K. SHIBATA","Kouji SHIBATA","Kouji Shibata","SHIBATA, Kouji"],"block_key":"k shibata","works_api_url":"https://api.openalex.org/works?filter=author.id:A5036036062","awards_count":1,"awards_api_url":"https://api.openalex.org/awards?filter=investigators.author.id:A5036036062","updated_date":"2026-11-10T14:30:39","created_date":"2016-06-24T00:00:00"}