{"id":"https://openalex.org/A5035831772","orcid":"https://orcid.org/0000-0002-8138-3052","observed_orcids":["https://orcid.org/0000-0002-8138-3052"],"display_name":"Charles V. Sammut","raw_author_names":["C V Sammut","C. Sammut","C. V. Sammut","C.V. Sammut","Charles Sammut","Charles V Sammut","Charles V. Sammut","Charles Victor Sammut","Charles. V. Sammut"],"full_name":"Charles V. Sammut","works_count":94,"cited_by_count":831,"summary_stats":{"2yr_mean_citedness":1.4,"h_index":15,"i10_index":18},"ids":{"openalex":"https://openalex.org/A5035831772","orcid":"https://orcid.org/0000-0002-8138-3052","observed_orcids":["https://orcid.org/0000-0002-8138-3052"]},"affiliations":[{"institution":{"id":"https://openalex.org/I197854408","ror":"https://ror.org/03a62bv60","display_name":"University of Malta","country_code":"MT","type":"education","lineage":["https://openalex.org/I197854408"]},"years":[2026,2025,2024,2023,2022,2021,2020,2019,2018,2017,2016,2015,2014,2013,2012,2002,1992]}],"last_known_institutions":[{"id":"https://openalex.org/I197854408","ror":"https://ror.org/03a62bv60","display_name":"University of Malta","country_code":"MT","type":"education","lineage":["https://openalex.org/I197854408"]}],"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","count":53,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","count":50,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","count":15,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10958","display_name":"Ultrasound and Hyperthermia Applications","count":14,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10069","display_name":"Antenna Design and Analysis","count":13,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T11739","display_name":"Microwave Imaging and Scattering Analysis","value":0.0006716,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","value":0.0003392,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","value":0.0001189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13463","display_name":"Nanoporous metals and alloys","value":0.0001045,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10958","display_name":"Ultrasound and Hyperthermia Applications","value":9.35e-05,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","score":0.87343430519104},{"id":"192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","score":0.8341565132141113},{"id":"41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","score":0.6301607489585876},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.5548709034919739},{"id":"49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","score":0.46098455786705017}],"counts_by_year":[{"year":1992,"works_count":1,"oa_works_count":0,"cited_by_count":3},{"year":2000,"works_count":1,"oa_works_count":1,"cited_by_count":1},{"year":2002,"works_count":1,"oa_works_count":0,"cited_by_count":1},{"year":2010,"works_count":2,"oa_works_count":0,"cited_by_count":2},{"year":2012,"works_count":1,"oa_works_count":0,"cited_by_count":20},{"year":2013,"works_count":3,"oa_works_count":2,"cited_by_count":75},{"year":2014,"works_count":2,"oa_works_count":1,"cited_by_count":147},{"year":2015,"works_count":3,"oa_works_count":1,"cited_by_count":4},{"year":2016,"works_count":4,"oa_works_count":0,"cited_by_count":127},{"year":2017,"works_count":7,"oa_works_count":3,"cited_by_count":70},{"year":2018,"works_count":17,"oa_works_count":3,"cited_by_count":111},{"year":2019,"works_count":14,"oa_works_count":2,"cited_by_count":75},{"year":2020,"works_count":6,"oa_works_count":4,"cited_by_count":36},{"year":2021,"works_count":8,"oa_works_count":3,"cited_by_count":41},{"year":2022,"works_count":6,"oa_works_count":3,"cited_by_count":72},{"year":2023,"works_count":8,"oa_works_count":5,"cited_by_count":32},{"year":2024,"works_count":2,"oa_works_count":1,"cited_by_count":4},{"year":2025,"works_count":5,"oa_works_count":4,"cited_by_count":10},{"year":2026,"works_count":3,"oa_works_count":3,"cited_by_count":0}],"display_name_alternatives":["C V Sammut","C. Sammut","C. V. Sammut","C.V. Sammut","Charles Sammut","Charles V Sammut","Charles V. Sammut","Charles Victor Sammut","Charles. V. Sammut"],"block_key":"c sammut","works_api_url":"https://api.openalex.org/works?filter=author.id:A5035831772","updated_date":"2026-10-16T12:29:29","created_date":"2016-06-24T00:00:00"}