{"id":"https://openalex.org/A5035672500","orcid":"https://orcid.org/0000-0001-9401-8030","observed_orcids":["https://orcid.org/0000-0001-9401-8030"],"display_name":"K. Shastry","raw_author_names":["K Shastry","K. Shastry","Karthik Shastry","Shastry K.","Shastry, K."],"full_name":"Dr. Karthik Shastry","works_count":47,"cited_by_count":106,"summary_stats":{"2yr_mean_citedness":0.0,"h_index":6,"i10_index":4},"ids":{"openalex":"https://openalex.org/A5035672500","orcid":"https://orcid.org/0000-0001-9401-8030","observed_orcids":["https://orcid.org/0000-0001-9401-8030"]},"affiliations":[{"institution":{"id":"https://openalex.org/I189196454","ror":"https://ror.org/019kgqr73","display_name":"The University of Texas at Arlington","country_code":"US","type":"education","lineage":["https://openalex.org/I189196454"]},"years":[2019,2017,2016,2015,2014,2013,2011]},{"institution":{"id":"https://openalex.org/I4389425378","ror":"https://ror.org/041re0e60","display_name":"R.V. College of Engineering","country_code":"IN","type":"education","lineage":["https://openalex.org/I4389425378"]},"years":[2019,2018,2017]}],"last_known_institutions":[{"id":"https://openalex.org/I189196454","ror":"https://ror.org/019kgqr73","display_name":"The University of Texas at Arlington","country_code":"US","type":"education","lineage":["https://openalex.org/I189196454"]},{"id":"https://openalex.org/I4389425378","ror":"https://ror.org/041re0e60","display_name":"R.V. College of Engineering","country_code":"IN","type":"education","lineage":["https://openalex.org/I4389425378"]}],"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","count":39,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","count":34,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10523","display_name":"Atomic and Molecular Physics","count":29,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","count":9,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13531","display_name":"Surface and Thin Film Phenomena","count":8,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"topic_share":[{"id":"https://openalex.org/T12579","display_name":"Muon and positron interactions and applications","value":0.0006189,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","value":0.0001117,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10523","display_name":"Atomic and Molecular Physics","value":4.7e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10657","display_name":"Topological Materials and Phenomena","value":4.12e-05,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11733","display_name":"X-ray Spectroscopy and Fluorescence Analysis","value":3.91e-05,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"x_concepts":[{"id":"202100949","wikidata":"https://www.wikidata.org/wiki/Q3229","display_name":"Positron","score":0.8628477454185486},{"id":"184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","score":0.7980844378471375},{"id":"147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","score":0.6793798208236694},{"id":"121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","score":0.6661242246627808},{"id":"185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","score":0.633671760559082}],"counts_by_year":[{"year":2008,"works_count":1,"oa_works_count":0,"cited_by_count":0},{"year":2009,"works_count":6,"oa_works_count":0,"cited_by_count":0},{"year":2010,"works_count":5,"oa_works_count":0,"cited_by_count":0},{"year":2011,"works_count":6,"oa_works_count":2,"cited_by_count":0},{"year":2012,"works_count":2,"oa_works_count":0,"cited_by_count":0},{"year":2013,"works_count":8,"oa_works_count":1,"cited_by_count":2},{"year":2014,"works_count":4,"oa_works_count":1,"cited_by_count":2},{"year":2015,"works_count":5,"oa_works_count":1,"cited_by_count":0},{"year":2016,"works_count":5,"oa_works_count":2,"cited_by_count":4},{"year":2017,"works_count":3,"oa_works_count":3,"cited_by_count":17},{"year":2018,"works_count":1,"oa_works_count":0,"cited_by_count":6},{"year":2019,"works_count":1,"oa_works_count":1,"cited_by_count":20},{"year":2020,"works_count":0,"oa_works_count":0,"cited_by_count":19},{"year":2021,"works_count":0,"oa_works_count":0,"cited_by_count":11},{"year":2022,"works_count":0,"oa_works_count":0,"cited_by_count":9},{"year":2023,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2024,"works_count":0,"oa_works_count":0,"cited_by_count":5},{"year":2025,"works_count":0,"oa_works_count":0,"cited_by_count":3},{"year":2026,"works_count":0,"oa_works_count":0,"cited_by_count":3}],"display_name_alternatives":["K Shastry","K. Shastry","Karthik Shastry","Shastry K.","Shastry, K."],"block_key":"k shastry","works_api_url":"https://api.openalex.org/works?filter=author.id:A5035672500","updated_date":"2026-11-03T12:34:24","created_date":"2016-06-24T00:00:00"}